Connector with reinforced mounting structure and method of manufacturing connector

ABSTRACT

A connector includes a wiring board; a lead connecting the wiring board electrically to an external board; and a conductive layer connecting the lead to the wiring board so as to allow the lead to move when the conductive layer is melted. The lead includes first through third regions. The first region, in contact with the conductive layer, is sandwiched between the second and third regions lower in wettability with respect to the liquid melt of the conductive layer than the first region. The wiring board includes a first region and second regions. The first region, in contact with the conductive layer, is sandwiched between the second regions lower in wettability with respect to the liquid melt than the first region. The center of the first region of the lead is offset and away from the external board relative to the center of the first region of the wiring board.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a division of U.S. patent application Ser.No. 12/503,159, filed on Jul. 15, 2009, now U.S. Pat. No. 7,837,475which is based on Japanese Priority Patent Applications No. 2008-209305,filed on Aug. 15, 2008, No. 2008-209306, filed on Aug. 15, 2008, and No.2008-209307, filed on Aug. 15, 2008. The disclosure of the priorapplications is hereby incorporated herein in its entirety by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a connector to be mounted on anexternal board, a connector mounting structure for mounting theconnector on the external board, and a method of manufacturing theconnector to be mounted on the external board.

2. Description of the Related Art

Data transmission systems include an ordinary transmission system and adifferential transmission system. The ordinary transmission systememploys an electric wire for each data item. The differentialtransmission system, using a pair of electric wires for each data item,simultaneously transmits a “+” signal to be transmitted and a “−” signalequal in magnitude and opposite in direction to the “+” signal. Thedifferential transmission system, which has the advantage of being lesssusceptible to noise compared with the ordinary transmission system, iswidely used in fields where signals are transmitted at high speed.

FIG. 1 is a schematic perspective view of a conventional differentialtransmission connector unit 1.

The differential transmission connector unit 1 includes a plug connector2 and a jack connector 3. The plug connector 2 is mounted on a backplane(external board) 4. The jack connector 3 is mounted at an end of adaughterboard (external board) 5. The jack connector 3 and the plugconnector 2 are connected so that the daughterboard 5 and the backplane4 are electrically connected by the connector unit 1. (See, for example,United States Patent Application Publication No. 2008/0108233 A1.)

FIG. 2 is an exploded perspective view of the conventional jackconnector 3.

As illustrated in FIG. 2, the jack connector 3 includes a firstinsulative housing 6, a second insulative housing 7, and multiplemodules 10. The first insulative housing 6 is configured to be fit in ahousing 8 (FIG. 1) of the plug connector 2. The second insulativehousing 7 is configured to support the modules 10 parallel to eachother.

FIG. 3 is a schematic perspective view of the conventional module 10.FIG. 4 is an exploded perspective view of the conventional module 10.

Referring to FIG. 3 and FIG. 4, the module 10 includes a wiring board 11with multiple pad electrodes 16; multiple leads 12 for electricallyconnecting the wiring board 11 and the external board 5 (FIG. 1);multiple solder layers (conductive layers) 17; and an insulative spacer13. The leads 12 are connected to the corresponding pad electrodes 16through the corresponding solder layers 17.

FIG. 5 is a cross-sectional view of part of the conventional module 10.

The spacer 13 is fixed on the wiring board 11. The spacer 13 hasmultiple guide grooves 132 on its surface facing the wiring board 11.The guide grooves 132 extend in a direction in which the leads 12extend. The leads 12 are allowed to move inside the corresponding guidegrooves 132 when the solder layers 17 melt.

FIG. 6A is a front-side cross-sectional view of the conventional jackconnector 3 placed on the daughterboard 5. FIG. 6B is a schematiccross-sectional view of the jack connector 3 of FIG. 6A taken alongone-dot chain line A-A.

A solder paste 19 for bonding the leads 12 is applied on the surface ofthe daughterboard 5. In the case illustrated in FIGS. 6A and 6B, thereis a gap between some of the leads 12 and the solder paste 19 because ofthe warpage of the daughterboard 5.

FIG. 7A is a front-side cross-sectional view of the conventional jackconnector 3 placed on the daughterboard 5 after heating (reflowsoldering). FIG. 7B is a schematic cross-sectional view of the jackconnector 3 of FIG. 7A taken along one-dot chain line A-A.

When the solder paste 19 is melted by heating, each solder layer 17melts, so that the leads 12 are movable inside the corresponding guidegrooves 132. In this state, the leads 12 are pushed into thecorresponding guide grooves 132 because of gravity so as to absorb thewarpage of the daughterboard 5. As a result, the leads 12 are connectedto the daughterboard 5 after heating.

SUMMARY OF THE INVENTION

According to one aspect of the present invention, a connector includes awiring board; a lead configured to connect the wiring board electricallyto an external board; a conductive layer configured to connect the leadto the wiring board so as to allow the lead to move in predetermineddirections relative to the wiring board when the conductive layer ismelted; and a reinforcement member configured to reinforce a mechanicalconnection of the wiring board and the external board.

According to one aspect of the present invention, a connector includes awiring board; a lead configured to connect the wiring board electricallyto an external board; and a conductive layer configured to connect thelead to the wiring board so as to allow the lead to move inpredetermined directions relative to the wiring board when theconductive layer is melted, wherein the lead includes a first region, asecond region, and a third region, the first region being in contactwith the conductive layer and being sandwiched between the second regionand the third region in directions parallel to the predetermineddirections, the second region and the third region being lower inwettability with respect to a liquid melt of the conductive layer thanthe first region, the wiring board includes a first region and a pair ofsecond regions, the first region being in contact with the conductivelayer and being sandwiched between the second regions in the directionsparallel to the predetermined directions, the second regions being lowerin wettability with respect to the liquid melt of the conductive layerthan the first region, and a center of the first region of the lead isoffset in a direction parallel to the predetermined directions and awayfrom the external board relative to a center of the first region of thewiring board.

According to one aspect of the present invention, a connector includes awiring board having a first side and a second side facing away from eachother; a plurality of leads configured to connect the wiring boardelectrically to an external board, the leads being provided on the firstand second sides of the wiring board; and a plurality of conductivelayers configured to connect the corresponding leads to the wiring boardso as to allow the leads to move in predetermined directions relative tothe wiring board when the conductive layers are melted, the conductivelayers being provided on the first and second sides of the wiring board.

According to one aspect of the present invention, a method ofmanufacturing a connector includes connecting a first lead to a firstside of a wiring board through a first conductive layer having a firstmelting point; and connecting a second lead to a second side of thewiring board through a second conductive layer having a second meltingpoint lower than the first melting point, the second side of the wiringboard facing away from the first side thereof, said connecting thesecond lead being performed at a temperature lower than the firstmelting point and higher than the second melting point.

BRIEF DESCRIPTION OF THE DRAWINGS

Other objects, features and advantages of the present invention willbecome more apparent from the following detailed description when readin conjunction with the accompanying drawings, in which:

FIG. 1 is a schematic perspective view of a conventional differentialtransmission connector unit;

FIG. 2 is an exploded perspective view of a conventional jack connector;

FIG. 3 is a schematic perspective view of a conventional module;

FIG. 4 is an exploded perspective view of the conventional module;

FIG. 5 is a cross-sectional view of part of the conventional module;

FIG. 6A is a front-side cross-sectional view of the conventional jackconnector placed on a daughterboard;

FIG. 6B is a schematic cross-sectional view of the jack connector ofFIG. 6A taken along one-dot chain line A-A;

FIG. 7A is a front-side cross-sectional view of the conventional jackconnector placed on the daughterboard after heating;

FIG. 7B is a schematic cross-sectional view of the jack connector ofFIG. 7A taken along one-dot chain line A-A;

FIG. 8 is a perspective view of a differential transmission connectorunit according to a first embodiment of the present invention;

FIG. 9 is an exploded perspective view of a jack connector of thedifferential transmission connector unit according to the firstembodiment of the present invention;

FIG. 10 is a cut-away view of the jack connector for illustrating theengagement relationship among a first insulative housing, a secondinsulative housing, and modules thereof according to the firstembodiment of the present invention;

FIG. 11 is an enlarged view of the encircled region indicated by arrow Ain FIG. 10 according to the first embodiment of the present invention;

FIG. 12 is an enlarged view of the encircled region indicated by arrow Bin FIG. 10 according to the first embodiment of the present invention;

FIG. 13 is a perspective view of a wiring board of the module accordingto the first embodiment of the present invention;

FIGS. 14A through 14G are diagrams illustrating a method (process) formanufacturing the wiring board according to the first embodiment of thepresent invention;

FIG. 15 is an enlarged perspective view of part of the wiring board,illustrating a configuration of each of first and second signal padelectrodes according to the first embodiment of the present invention;

FIGS. 16A through 16D are diagrams illustrating a first method offorming regions different in wettability according to the firstembodiment of the present invention;

FIGS. 17A through 17C are diagrams illustrating a second method offorming regions different in wettability according to the firstembodiment of the present invention;

FIGS. 18A and 18B are diagrams illustrating a third method of formingregions different in wettability according to the first embodiment ofthe present invention;

FIGS. 19A through 19D are diagrams illustrating a fourth method offorming regions different in wettability according to the firstembodiment of the present invention;

FIGS. 20A and 20B are perspective views of a first signal lead (a secondsignal lead) according to the first embodiment of the present invention;

FIG. 21 is a perspective view of the wiring board, illustrating a methodof joining (connecting) signal lead pairs and signal pad electrode pairsaccording to the first embodiment of the present invention;

FIG. 22 is a cross-sectional view of part of the module, illustratingthe positional relationship between the first signal lead (the secondsignal lead) and the first signal pad electrode (the second signal padelectrode) according to the first embodiment of the present invention;

FIGS. 23A and 23B are perspective views of a spacer of the moduleaccording to the first embodiment of the present invention;

FIGS. 24A and 24B are cross-sectional views illustrating placement ofthe jack connector on a daughterboard according to the first embodimentof the present invention;

FIGS. 25A and 25B are cross-sectional views after heating the structureof FIGS. 24A and 24B, illustrating a mounting structure of the jackconnector according to the first embodiment of the present invention;

FIG. 26 is a schematic cross-sectional view of a plug connector of thedifferential transmission connector unit according to the firstembodiment of the present invention;

FIG. 27 is an enlarged view of a region indicated by box A in FIG. 26according to the first embodiment of the present invention;

FIG. 28 is a perspective view of an insulative housing of the plugconnector according to the first embodiment of the present invention;

FIGS. 29A and 29B are cross-sectional views illustrating a firstvariation according to the first embodiment of the present invention;

FIG. 30 is an exploded perspective view of the jack connector accordingto a second variation of the first embodiment of the present invention;

FIG. 31 is a cut-away view of the jack connector for illustrating theengagement relationship among the first insulative housing, the secondinsulative housing, and the modules thereof according to the secondvariation of the first embodiment of the present invention;

FIG. 32 is a perspective view of the wiring board, illustrating aconfiguration thereof according to the second variation of the firstembodiment of the present invention;

FIG. 33 is a perspective view of the wiring board, illustrating a methodof joining (connecting) leads and pad electrodes according to the secondvariation of the first embodiment of the present invention;

FIGS. 34A and 34B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 34A,respectively, of part of the jack connector and the daughterboard,illustrating placement of the jack connector on the daughterboardaccording to the second variation of the first embodiment of the presentinvention;

FIGS. 35A and 35B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 35A,respectively, of part of the jack connector and the daughterboard afterheating the structure of FIGS. 34A and 34B, illustrating a mountingstructure of the jack connector according to the second variation of thefirst embodiment of the present invention;

FIG. 36 is a schematic cross-sectional view of the plug connector,illustrating a configuration thereof according to the second variationof the first embodiment of the present invention;

FIG. 37 is a cut-away view of another jack connector according to thesecond variation of the first embodiment of the present invention;

FIG. 38 is a cross-sectional view of part of the other jack connector,illustrating the positional relationship between a lead and acorresponding pad electrode 16B according to the second variation of thefirst embodiment of the present invention;

FIG. 39 is an enlarged perspective view of part of the wiring board,illustrating a configuration of each pad electrode according to thesecond variation of the first embodiment of the present invention;

FIG. 40 is a cross-sectional view illustrating the positionalrelationship between a lead and a pad electrode in a case where multipleconductive layers are provided between the lead and the pad electrodeaccording to the second variation of the first embodiment of the presentinvention;

FIG. 41 is a schematic diagram illustrating part of a module for thejack connector according to a second embodiment of the presentinvention;

FIG. 42 is a cross-sectional view of the structure of FIG. 41 takenalong one-dot chain line A-A according to the second embodiment of thepresent invention;

FIGS. 43A through 43H are diagrams illustrating a method (process) formanufacturing a wiring board according to the second embodiment of thepresent invention;

FIGS. 44A and 44B are diagrams illustrating a method of joining leadsand corresponding pad electrodes, which is part of a method ofmanufacturing the jack connector according to the second embodiment ofthe present invention;

FIGS. 45A and 45B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 45A,respectively, of part of the jack connector and the daughterboard,illustrating placement of the jack connector on the daughterboardaccording to the second embodiment of the present invention;

FIGS. 46A and 46B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 46A,respectively, of part of the jack connector and the daughterboard afterheating the structure of FIGS. 45A and 45B, illustrating a mountingstructure of the jack connector according to the second embodiment ofthe present invention; and

FIG. 47 is a cross-sectional view of the module according to a variationof the second embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

As described above, according to United States Patent ApplicationPublication No. 2008/0108233 A1, the leads 12 are pushed into thecorresponding guide grooves 132 because of gravity so as to absorb orcounter the warpage of the daughterboard 5, so that the leads 12 areconnected to the daughterboard 5 after heating.

However, since the leads 12 are surface-mounted on the daughterboard 5by soldering, an external stress may be applied to the connections(soldered parts) of the leads 12 and the daughterboard 5 on applicationof an external stress to the connector unit 1 or the daughterboard 5, sothat the connections may be degraded.

Further, since the solder layers 17 melt at the time of mounting theleads 12 on the daughterboard 5, the molten solder of the solder layers17 may move on the leads 12 and the wiring board 11 so as to causeunintended damage to the surroundings.

Moreover, it is desired to reduce the size of such a connector whereleads are allowed to move so as to absorb the warpage of an externalsubstrate at the time of mounting the leads (connector) thereon asillustrated in United States Patent Application Publication No.2008/0108233 A1.

According to one aspect of the present invention, a connector isprovided whose leads are movable so as to absorb the warpage of anexternal board at the time of mounting and whose durability against anexternal stress is improved.

According to one aspect of the present invention, a connector isprovided whose leads are movable so as to absorb the warpage of anexternal board at the time of mounting and that prevents the liquid meltof a conductive layer from causing unintended damage to thesurroundings.

According to one aspect of the present invention, a connector isprovided whose leads are movable so as to absorb the warpage of anexternal board at the time of mounting and that is reduced in size.

According to one aspect of the present invention, a connector mountingstructure for mounting one or more of the above-described connectors onan external board is provided.

According to one aspect of the present invention, a method ofmanufacturing one or more of the above-described connectors is provided.

A description is given below, with reference to the accompanyingdrawings, of embodiments of the present invention.

First Embodiment

FIG. 8 is a perspective view of a differential transmission connectorunit 1A according to a first embodiment of the present invention. InFIG. 8 and subsequent drawings for the first embodiment, the sameelements as those illustrated in FIG. 1 through FIG. 7B are referred toby the same reference numerals.

Referring to FIG. 8, the differential transmission connector unit 1Aincludes a plug connector 2A and a jack connector 3A. The plug connector2A is mounted on a backplane (external board or circuit board) 4A. Thejack connector 3A is mounted at an end of a daughterboard (externalboard or circuit board) 5A. The jack connector 3A and the plug connector2A are connected so that the daughterboard 5A and the backplane 4A areelectrically connected by the connector unit 1A.

In FIG. 8 and subsequent drawings for the first embodiment, Y1-Y2indicates the directions in which the jack connector 3A and the plugconnector 2A are connected relative to each other, Z1-Z2 indicates thedirections in which leads 12A (FIG. 9) extend, and X1-X2 indicates thedirections in which multiple modules 10A (FIG. 9) of the jack connector3A are arranged. Further, Y1 indicates the direction in which the plugconnector 2A is mounted on the backplane 4A, and Z2 indicates thedirection in which the jack connector 3A is mounted on the daughterboard5A. The X1-X2 directions, Y1-Y2 directions, and Z1-Z2 directions areperpendicular to one another.

A description is given below first of a configuration of the jackconnector 3A and then of a configuration of the plug connector 2A.

FIG. 9 is an exploded perspective view of the jack connector 3A.

The jack connector 3A includes a first insulative housing 6A, a secondinsulative housing 7A, and the multiple modules 10A.

The first insulative housing 6A is configured to be fit to an insulativehousing 8A of the plug connector 2A (FIG. 8). Although not graphicallyillustrated, multiple plug-side contacts are arranged in rows (X1-X2directions) and columns (Z1-Z2 directions) inside the insulative housing8A of the plug connector 2A.

As illustrated in FIG. 9, multiple openings 62A corresponding to theplug-side contacts are formed in the first insulative housing 6A. Thefirst insulative housing 6A is fit into the insulative housing 8A sothat the plug-side contacts are inserted into the first insulativehousing 6A through the corresponding openings 62A to be connected tocorresponding jack-side contacts 15A, thereby establishing an electricalconnection between the jack connector 3A and the plug connector 2A.

The second insulative housing 7A is configured to support the multiplemodules 10A (that is, multiple wiring boards 11A) parallel to eachother. For example, the second insulative housing 7A has a comb shapewith multiple slits 72A as illustrated in FIG. 9. The multiple slits 72Aare arranged in the X1-X2 directions. The modules 10A are incorporatedin the corresponding slits 72A on a one-to-one basis.

FIG. 10 is a cut-away view of the jack connector 3A for illustrating theengagement relationship among the first insulative housing 6A, thesecond insulative housing 7A, and the modules 10A. FIG. 11 is anenlarged view of the encircled region indicated by arrow A in FIG. 10.FIG. 12 is an enlarged view of the encircled region indicated by arrow Bin FIG. 10.

As illustrated in FIG. 9 through FIG. 11, the second insulative housing7A includes three first tongue piece parts 74A. On the other hand, thefirst insulative housing 6A includes three cutout parts 64Acorresponding to the three first tongue piece parts 74A. The firstinsulative housing 6A and the second insulative housing 7A are connectedwith the first tongue piece parts 74A inserted into and attached to thecutout parts 64A.

The second insulative housing 7A further includes three second tonguepiece parts 76A (FIG. 9). On the other hand, the first insulativehousing 6A includes three slit parts 66A (FIG. 9) corresponding to thethree second tongue piece parts 76A. The first insulative housing 6A andthe second insulative housing 7A are connected with the second tonguepiece parts 76A inserted into and attached to the slit parts 66A.

The second insulative housing 7A further includes a step-shapedprojecting part 78A in each slit 72A as illustrated in FIG. 10 and FIG.11. On the other hand, each module 10A (including the wiring board 11Aand a spacer 13A [FIG. 9]) includes a recess part 18A (FIG. 12)corresponding to the projecting part 78A. Referring to FIG. 12, therecess part 18A includes a recess part 118A of the wiring board 11A anda recess part 138A of the spacer 13. The second insulative housing 7Aand the modules 10A are connected with the projecting parts 78A fit intothe corresponding recess parts 18A.

The second insulative housing 7A further includes fixation metal parts71A (FIG. 9). For example, the fixation metal parts 71A are formed bybending a metal plate into an L-letter shape. The fixation metal parts71A have their respective first ends press-fit into and fixed to thesecond insulative housing 7A. The fixation metal parts 71A have theirrespective second ends mounted on the surface of the daughterboard(external board) 5A when the leads 12A (FIG. 9) of the modules 10A areconnected to the daughterboard 5A. Thus, the second insulative housing7A is attached to the daughterboard 5A through the fixation metal parts71A.

Accordingly, the mechanical connection of the wiring boards 11A and thedaughterboard 5A is reinforced by the second insulative housing 7A and aconnection mechanism formed of the projecting parts 78A and the recessparts 18A. Therefore, even when an external stress such as vibration orimpact is applied to the jack connector 3A or the daughterboard 5A, themovements of the wiring boards 11A and the daughterboard 5A relative toeach other are limited or prevented, so that the deformation of theleads 12A connecting the wiring boards 11A and the daughterboard 5A iscontrolled. As a result, transmission of the external stress to theconnections of the leads 12A and the daughterboard 5A is controlled, sothat the degradation of the connections, such as occurrence of peelingor a crack in a soldering part (for example, an adhesive agent 19A inFIG. 25A), is controlled, thus resulting in increased durability againstthe external stress.

Referring to FIG. 9, each of the modules 10A includes the wiring board11A with multiple pad electrodes 16A; the multiple leads 12A forelectrically connecting the wiring board 11A and the daughterboard 5A(FIG. 8); multiple conductive layers 17A; and the insulative spacer(guide part) 13A.

FIG. 13 is a perspective view of the wiring board 11A, which may be, forexample, a printed wiring board (PWB). The wiring board 11A may have,for example, a three-layer structure of an insulating layer 112A ofpolyimide or the like and interconnection patterns (wiring patterns)113A of Cu, Al, or the like successively stacked on a metal plate 111Aof phosphor bronze or the like as illustrated in FIG. 13.

The wiring board 11A may be manufactured by a common method such as oneusing photolithography and etching.

FIGS. 14A through 14G are diagrams illustrating a method (process) formanufacturing the wiring board 11A.

In the illustrated case, first, as illustrated in FIG. 14A,photosensitive polyimide ink is applied and dried on the phosphor bronzemetal plate 111A, thereby forming the insulating layer 112A on the metalplate 111A.

Next, as illustrated in FIG. 14B, the insulating layer 112A is exposedand developed using a photomask (not graphically illustrated).

Next, as illustrated in FIG. 14C, a Ni—W film 51A is deposited (stacked)on the structure of FIG. 14B by sputtering.

Next, as illustrated in FIG. 14D, a Cu film 52A is deposited (stacked)on the Ni—W film 51A by electroplating.

Next, as illustrated in FIG. 14E, a photoresist pattern 53A is formed onthe Cu film 52A.

Next, as illustrated in FIG. 14F, the Cu film 52A and the Ni—W film 51Aare etched using the photoresist pattern 53A.

Next, as illustrated in FIG. 14G, the photoresist pattern 53A isremoved, so that the interconnection patterns 113A and pad electrodes16A are formed of the Cu film 52A.

As described above, the wiring board 11A of this embodiment has athree-layer structure of the insulating layer 112A and theinterconnection patterns 113A successively stacked on the metal plate111A. Alternatively, the wiring board 11A may have a two-layer structureof the interconnection patterns 113A of Cu or the like stacked on theinsulating layer 112A of an insulating film of polyimide or the like. Inthe case of the two-layer structure, a ground plate may be providedbetween adjacent wiring boards 11A to reduce crosstalk. Further, thewiring board 11A may be either rigid or flexible.

As illustrated in FIG. 13, the wiring board 11A includes four contactgroups 150A, four pad electrode groups 160A, and the fourinterconnection patterns 113A each formed of a signal interconnect pair142A. The four contact groups 150A are aligned in the Z1-Z2 directions.The four pad electrode groups 160A are aligned in the Y1-Y2 directions.The wiring board 11A further includes ground interconnects 148A.

Each signal interconnect pair 142A includes a first signal interconnect144A and a second signal interconnect 146A for transmitting positive andnegative signals, respectively, having complementary waveforms in axialsymmetry. Although not graphically illustrated, a ground interconnectmay be provided between adjacent signal interconnect pairs 142A in orderto reduce crosstalk.

Each contact group 150A includes a signal contact pair 152A and a groundcontact 158A. The signal contact pair 152A includes a first signalcontact 154A and a second signal interconnect 156A for transmittingpositive and negative signals, respectively, having complementarywaveforms in axial symmetry. In the description of this embodiment, thefirst and second signal contacts 154A and 156A and the ground contacts158A may be collectively referred to as “contacts 15A” (FIG. 9) in thecase of not distinguishing them in particular.

The contacts 15A have a bifurcated fork shape and are integrated withthe wiring board 11A into a unitary structure. Alternatively, thecontacts 15A may also be formed as components separate from the wiringboard 11A. In this case, the contacts 15A may be fixed to the wiringboard 11A by insert molding or soldering.

The ends of the contacts 15A are bent into a V-letter shape so as toproject in a direction (the X2 direction) perpendicular to thedirections (Y1-Y2 directions) in which the contacts 15A extend, so thatthe ends of the contacts 15A deform elastically when pressed in the X1direction. The restoration force to restore their original shapes beforethis elastic deformation ensures the connection of the jack-sidecontacts 15A and the plug-side contacts of the plug connector 2A. Thisensures the electrical connection of the jack connector 3A and the plugconnector 2A.

The first and second signal interconnects 144A and 146A of each signalinterconnect pair 142A have their respective first (Y1) ends bifurcatingto extend to the X2-side surfaces of the first and second signalcontacts 154A and 156A, respectively, of the corresponding signalcontact pair 152A.

As illustrated in FIG. 13, the ground contacts 158A alternate with thesignal contact pairs 152A so as to reduce crosstalk between adjacentsignal contact pairs 152A. The ground interconnects 148A have theirrespective first (Y1) ends bifurcating to extend to the X2-side surfacesof the corresponding ground contacts 158A. The ground interconnects 148Ahave their respective second (Y2) ends electrically connected to themetal plate 111A via corresponding through holes 114A formed through theinsulating layer 112A.

Each pad electrode group 160A includes a signal pad electrode pair 162Aand a ground pad electrode 168A. The signal pad electrode pair 162Aincludes a first signal pad electrode 164A and a second signal padelectrode 166A for transmitting positive and negative signals,respectively, having complementary waveforms in axial symmetry. In thedescription of this embodiment, the first and second signal padelectrodes 164A and 166A and the ground pad electrodes 168A may becollectively referred to as “pad electrodes 16A” (FIG. 9) in the case ofnot distinguishing them in particular.

The first and second signal pad electrodes 164A and 166A are connectedto second (Z2) ends of the corresponding first and second signalinterconnects 144A and 146A, respectively. Thus, the first and secondsignal interconnects 144A and 146A connect the corresponding first andsecond signal contacts 154A and 156A and the corresponding first andsecond signal pad electrodes 164A and 166A.

FIG. 15 is an enlarged perspective view of part of the wiring board 11A,illustrating a configuration of each of the first and second signal padelectrodes 164A and 166A.

For example, the first and second signal pad electrodes 164A and 166Ahave a rectangular shape as illustrated in FIG. 15. Each of the firstand second signal pad electrodes 164A and 166A includes a first region42A to come into contact with the corresponding conductive layer 17A;and a pair of second regions 44A, one on each side of the first region42A in the directions (Z1-Z2 directions) in which the leads 12A extendso that the first region 42A is sandwiched between the second regions44A. The second regions 44A are lower in wettability with respect to theliquid melt of the conductive layer 17A than the first region 42A. Thatis, each of the first and second signal pad electrodes 164A and 166Aincludes a low wettability region (the second region 44A), a highwettability region (the first region 42A), and a low wettability region(the second region 44A) in this order in the Z2 direction from the Z1side.

The wiring board 11A has the insulating layer 112A on both lateral sides(Y1 and Y2 sides) of the pad electrodes 16A. The insulating layer 112Aserves as a third region having low wettability with respect to theliquid melt (molten solder) of the conductive layers 17A compared withthe pad electrodes 16A.

The conductive layers 17A may be formed of, for example, solder such aslead-free solder. In this case, the first regions 42A may be formed of ametal having high solder wettability, while the second regions 44A maybe formed of a metal having low solder wettability, resin, or an oxidecoating. Any appropriate method may be employed to form such regionsdifferent in wettability. Such a method uses, for example,photolithography and etching. FIGS. 16A through 16D, FIGS. 17A through17C, FIGS. 18A and 18B, and FIGS. 19A through 19D are diagramsillustrating first through fourth methods, respectively, of formingregions different in wettability according to this embodiment.

[First Method]

In the case illustrated in FIGS. 16A through 16D, first, as illustratedin FIG. 16A, a Ni layer 91A and a Au layer 92A are successivelydeposited on the first and second Cu signal pad electrodes 164A and 166A(16A) formed in FIG. 14G by electroplating.

Next, as illustrated in FIG. 16B, a photoresist pattern 93A is formed onthe Au layer 92A.

Next, as illustrated in FIG. 16C, the Au layer 92A is etched using thephotoresist pattern 93A.

Next, as illustrated in FIG. 16D, the photoresist pattern 93A isremoved.

As a result, the Au layer 92A is deposited (stacked) on part of the Nilayer 91A. The Ni layer 91A is lower in solder wettability than the Aulayer 92A. Accordingly, it is possible to form regions different insolder wettability.

[Second Method]

In the case illustrated in FIGS. 17A through 17C, first, as illustratedin FIG. 17A, a photoresist pattern 94A is formed on the first and secondCu signal pad electrodes 164A and 166A (16A) formed in FIG. 14G.

Next, as illustrated in FIG. 17B, a Ni layer 91A and a Au layer 92A aresuccessively deposited on the parts of the first and second signal padelectrodes 164A and 166A exposed outside by electroplating.

Next, as illustrated in FIG. 17C, the photoresist pattern 94A isremoved.

As a result, the Au layer 92A is deposited (stacked) on parts of thefirst and second Cu signal pad electrodes 164A and 166A. The first andsecond Cu signal pad electrodes 164A and 166A are lower in solderwettability than the Au layer 92A. Accordingly, it is possible to formregions different in solder wettability.

[Third Method]

In the case illustrated in FIGS. 18A and 18B, first, as illustrated inFIG. 18A, a Ni layer 91A and a Au layer 92A are successively depositedon the first and second Cu signal pad electrodes 164A and 166A (16A)formed in FIG. 14G by electroplating.

Next, as illustrated in FIG. 18B, solder resist is applied and dried onpart of the Au layer 92A, so that an epoxy resin layer 95A is formed.

As a result, the epoxy resin layer 95A is stacked on part of the Aulayer 92A. The epoxy resin layer 95A is lower in solder wettability thanthe Au layer 92A. Accordingly, it is possible to form regions differentin solder wettability. Instead of forming the epoxy resin layer 95Ausing solder resist, a polyimide resin layer may be formed usingpolyimide ink.

[Fourth Method]

In the case illustrated in FIGS. 19A through 19D, first, as illustratedin FIG. 19A, a photoresist pattern 96A is formed on the first and secondCu signal pad electrodes 164A and 166A (16A) formed in FIG. 14G.

Next, as illustrated in FIG. 19B, a Cu oxide coating 97A is formed onthe parts of the first and second Cu signal pad electrodes 164A and 166Aexposed outside by heat treatment.

Next, as illustrated in FIG. 19C, the photoresist pattern 96A isremoved.

Next, as illustrated in FIG. 19D, a Ni layer 91A and a Au layer 92A aresuccessively deposited on the parts of the first and second signal padelectrodes 164A and 166A exposed outside by electroplating.

As a result, both of the Cu oxide coating 97A and the Au layer 92A areexposed outside. The Cu oxide coating 97A is lower in solder wettabilitythan the Au layer 92A. Accordingly, it is possible to form regionsdifferent in solder wettability.

As illustrated in FIGS. 16A through 16D, FIGS. 17A through 17C, FIGS.18A and 18B, and FIGS. 19A through 19D, the methods of forming regionsdifferent in wettability may stack an upper layer on the entire regionof a lower layer different in wettability from the upper layer andexpose the lower layer by etching part of the stacked upper layer; orstack an upper layer on part of a lower layer different in wettabilityfrom the upper layer. The lower layer/upper layer relationship may beeither a high wettability layer/low wettability layer or a lowwettability layer/high wettability layer. Further, regions different inwettability may also be formed by forming two layers different inwettability on different regions on a substrate.

The ground pad electrodes 168A are electrically connected to thebackside metal plate 111A via corresponding through holes 115A (FIG. 13)formed through the insulating layer 112A. The ground pad electrodes 168Aalternate with the signal pad electrode pairs 162A so as to reducecrosstalk between adjacent signal pad electrode pairs 162A.

Referring to FIG. 13, the wiring board 11A may further include a pair ofprojecting parts 182A. The projecting parts 182A are provided separatelyfrom the leads 12A so as to project toward the daughterboard 5A from thewiring board 11A to be attached to the daughterboard 5A. For example,the projecting parts 182A are provided so as to have the leads 12interposed between them as illustrated in FIG. 13.

The projecting parts 182A have, for example, an L-letter shape, and areformed integrally with the wiring board 11A by processing the metalplate 111A. Alternatively, the projecting parts 182A may be formed ascomponents separate from the wiring board 11A. In this case, theprojecting parts 182A may be connected to the wiring board 11A by insertmolding or press-fitting.

For example, the projecting parts 182A are mounted on the surface of thedaughterboard 5A by soldering at the time of connecting the leads 12A tothe daughterboard 5A, so as to reinforce the mechanical connection ofthe wiring board 11A and the daughterboard 5A. Therefore, even when anexternal stress such as vibration or impact is applied to the jackconnector 3A or the daughterboard 5A, the movements of the wiring boards11A and the daughterboard 5A relative to each other are limited orprevented, so that the deformation of the leads 12A connecting thewiring boards 11A and the daughterboard 5A is controlled. As a result,transmission of the external stress to the connections of the leads 12Aand the daughterboard 5A is controlled, so that the degradation of theconnections, such as occurrence of peeling or a crack in a solderingpart (for example, an adhesive agent 19A in FIG. 25A), is controlled,thus resulting in increased durability against the external stress.

The projecting parts 182A may be larger in cross section than the leads12A. This makes it possible to reinforce the mechanical connection ofthe wiring boards 11A and the daughterboard 5A and thus increasedurability against the external stress more effectively.

Referring to FIG. 9 and FIG. 10 as well as FIG. 13, each module 10Aincludes multiple signal lead pairs 122A each including a first signallead 124A and a second signal lead 126A. Further, each module 10A(wiring board 11A) includes multiple ground leads 128A. The first andsecond signal leads 124A and 126A and the ground leads 128A areconfigured to connect the wiring boards 11A electrically to thedaughterboard 5A, and extend in the Z1-Z2 directions. The first andsecond signal leads 124A and 126A are configured to transmit positiveand negative signals, respectively, having complementary waveforms inaxial symmetry. On the other hand, the ground leads 128A alternate withthe signal lead pairs 122A so as to reduce crosstalk between adjacentsignal lead pairs 122A. In the description of this embodiment, the firstand second signal leads 124A and 126A and the ground leads 128A may becollectively referred to as “leads 12A” (FIG. 9) in the case of notdistinguishing them in particular.

The ground leads 128A are directly connected to the wiring boards 11Awithout intervention of the conductive layers 17A. For example, asillustrated in FIG. 13, the ground leads 128A have a linear shape, andare formed integrally with the wiring board 11A by processing the metalplate 111A. The ground leads 128A may be formed as components separatefrom the wiring board 11A. In this case, the ground leads 128A may have,for example, an L-letter shape, and have their first (base) endspress-fit into corresponding through holes of the wiring board 11A andhave their second (free) ends projecting toward the daughterboard 5 fromthe wiring board 11A.

Further, the ground leads 128A are configured to be press-fit intocorresponding through holes 54A (FIG. 24A and FIG. 25A) of thedaughterboard 5A, and have a so-called “press-fit pin” shape. The groundleads 128A are press-fit into the corresponding through holes 54A of thedaughterboard 5A to reinforce the mechanical connection of the wiringboards 11A and the daughterboard 5A (FIG. 24A and FIG. 25A).

If the ground leads 128A had a conventional L-letter shape and weremounted on the surface of the daughterboard 5A, an external force wouldbe applied to the connections of the ground leads 128A and thedaughterboard 5A on application of an external force to the jackconnector 3A or the daughterboard 5A, so that the connections would belikely to degrade.

On the other hand, the ground leads 128A are press-fit into the throughholes 54A of the daughterboard 5A. Therefore, when an external force isapplied to the jack connector 3A or the daughterboard 5A, a restorationforce to restore the original shapes of the press-fit parts of theground leads 128A and the through holes 54A before elastic deformationis generated. Accordingly, compared with the conventional case, it ispossible to reinforce the mechanical connection of the wiring boards 11Aand the daughterboard 5A. Therefore, even when an external stress suchas vibration or impact is applied to the jack connector 3A or thedaughterboard 5A, the movements of the wiring boards 11A and thedaughterboard 5A relative to each other are limited or prevented, sothat the deformation of the leads 12A connecting the wiring boards 11Aand the daughterboard 5A is controlled. As a result, transmission of theexternal stress to the connections of the leads 12A and thedaughterboard 5A is controlled, so that the degradation of theconnections, such as occurrence of peeling or a crack in a solderingpart (for example, the adhesive agent 19A in FIG. 25A), is controlled,thus resulting in increased durability against the external stress.

The ground leads 128A according to this embodiment are press-fit intothe through holes 54A of the daughterboard 5A. Accordingly, comparedwith the case of surface-mounting, it is possible to perform positioningwith respect to the daughterboard 5A.

The ground leads 128A may be larger in cross section than the first andsecond signal leads 124A and 126A. This makes it possible to reinforcethe mechanical connection of the wiring boards 11A and the daughterboard5A and thus increase durability against the external stress.

On the other hand, the first and second signal leads 124A and 126A areconnected to the first and second signal pad electrodes 164A and 166A(FIG. 13 and FIG. 15), respectively, through the correspondingconductive layers 17A (FIG. 9) provided between them.

FIGS. 20A and 20B are perspective views of the first signal lead 124A(the second signal lead 126A). FIG. 20A illustrates the X2-side face ofthe first signal lead 124A (the second signal lead 126A) and FIG. 20Billustrates the X1-side face of the first signal lead 124A (the secondsignal lead 126A). The first and second signal leads 124A and 126A areformed by bending a metal plate of phosphor bronze or a Fe-42Ni alloyinto an L-letter shape and processing it.

Each of the first and second signal leads 124A and 126A includes a firstregion 41A to come into contact with the corresponding conductive layer17A; and a second region 45A on the daughterboard 5A side (Z2 side) ofthe first region 41A. The second region 45A is lower in wettability withrespect to the liquid melt of the conductive layer 17A than the firstregion 41A.

Each of the first and second signal leads 124A and 126A may furtherinclude a third region 47A across the first region 41A from the secondregion 45A. The third region 47A is lower in wettability with respect tothe liquid melt of the conductive layer 17A than the first region 41A.

Each of the first and second signal leads 124A and 126A may furtherinclude a fourth region 43A to come into contact with the adhesive agent19A (FIG. 24A and FIG. 25A) on the daughterboard 5A side (Z2 side) ofthe second region 45A. The adhesive agent 19A adheres (bonds) the firstand second signal leads 124A and 126A to the daughterboard 5A. Thefourth region 43A is higher in wettability with respect to the liquidmelt of the adhesive agent 19A than the second region 45A. In otherwords, the second region 45A is lower in wettability with respect to theliquid melt of the adhesive agent 19A than the fourth region 43A.

Accordingly, in the case illustrated in FIGS. 20A and 20B, each of thefirst and second signal leads 124A and 126A includes a low wettabilityregion (the third region 47A), a high wettability region (the firstregion 41A), a low wettability region (the second region 45A), and ahigh wettability region (the fourth region 43A) in this order in the Z2direction from the Z1 side.

As illustrated in FIGS. 20A and 20B, each of the first, second, third,and fourth regions 41A, 45A, 47A, and 43A may be provided on each of theX1, X2, Y1, and Y2 sides of the first and second signal leads 124A and126A so as to define their peripheral surfaces.

The conductive layers 17A (FIG. 9) may be formed of, for example,solder. In this case, referring to FIGS. 20A and 20B, the first region41A and the fourth region 43A are formed of a metal having high solderwettability, while the second region 45A and the third region 47A areformed of a metal having low solder wettability, resin, or an oxidecoating. Any appropriate method may be employed to form such regionsdifferent in wettability. Such a method uses, for example,photolithography and etching the same as in the case of the first andsecond signal pad electrodes 164A and 166A. For example, the methodillustrated in FIGS. 16A through 16D, FIGS. 17A through 17C, FIGS. 18Aand 18B, or FIGS. 19A through 19D may be employed.

FIG. 21 is a perspective view of the wiring board 11A, illustrating amethod of joining (connecting) the signal lead pairs 122A and the signalpad electrode pairs 162A.

Referring to FIG. 21, the signal lead pairs 122A are held atpredetermined intervals by an end plate 192A. The signal lead pairs 122Aand the end plate 192A are formed as a unitary structure by processing ametal plate of phosphor bronze or a Fe-42Ni alloy into a comb shape byblanking. The end plate 192A includes a pair of through holes 196Acorresponding to a pair of through holes 116A provided in the wiringboard 11A.

According to the joining method illustrated in FIG. 21, first, a solderpaste (not graphically illustrated) such as a Sn—Bi alloy having amelting point of approximately 140° C. is applied on the first andsecond signal pad electrodes 164A and 166A. The area of application ofthe solder paste may correspond to the first regions 42A (FIG. 15) ofthe first and second signal pad electrodes 164A and 166A and the firstregions 41A (FIGS. 20A and 20B) of the corresponding first and secondsignal leads 124A and 126A. In this case, it is ensured that the solderpaste melted by below-described heat treatment spreads over and wetsboth of the first regions 42A and the first regions 41A whilecontracting in volume to crush air gaps inside the solder paste.Further, in this case, the molten solder paste moves from the secondregions 44A and 45A of lower solder wettability to the first regions 42Aand 41A, respectively, of higher solder wettability.

After application of the solder paste, pins (not graphicallyillustrated) are inserted through the through holes 116A and the throughholes 196A after aligning the through holes 116A and the through holes196A. Thereby, the signal pad electrode pairs 162A and the correspondingsignal lead pairs 122A are aligned.

Next, the solder paste is melted by heat treatment and then solidifiedto form the conductive layers (solder layers) 17A. As a result, thefirst and second signal leads 124A and 126A are connected to thecorresponding first and second signal pad electrodes 164A and 166Athrough the conductive layers 17A. Then, the pins are removed and theend plate 192A is broken off.

FIG. 22 is a cross-sectional view of part of the module 10A,illustrating the positional relationship between the first signal lead124A (the second signal lead 126A) and the first signal pad electrode164A (the second signal pad electrode 166A).

The spacer 13A is fixed to the wiring board 11A. The spacer 13A hasmultiple guide grooves 132A on its surface (X1-side surface) facing thewiring board 11A. The first and second signal leads 124A and 126A aremovable inside the corresponding guide grooves 132A when the conductivelayers (solder layers) 17A melt.

FIGS. 23A and 23B are X2-side and X1-side perspective views,respectively, of the spacer 13A.

The spacer (guide part) 13A is configured to guide the first and secondsignal leads 124A and 126A in the directions (Z1-Z2 directions) in whichthe leads 124A and 126A extend when the conductive layers (solderlayers) 17A melt. The spacer 13A includes the multiple guide grooves132A, multiple window parts 134A, and multiple projecting parts 136A.

The guide grooves 132A are provided along the directions (the Z1-Z2directions) in which the corresponding first and second signal leads124A and 126A extend. The first and second signal leads 124A and 126Aare movable inside the corresponding guide grooves 132A when theconductive layers (solder layers) 17A melt.

The window parts 134A are formed near the guide grooves 132A. Thisallows the conductive layers (solder layers) 17A to be heated from bothends (Z1 and Z2 ends) of the guide grooves 132A. This ensures that theconductive layers (solder layers) 17A are melted by heat treatment.

The projecting parts 136A correspond to multiple recess parts 117A (FIG.21) provided on the wiring board 11A. The projecting parts 136A are fitinto the corresponding recess parts 117A, so that the spacer 13A and thewiring board 11A are connected. This allows the guide grooves 132A andthe first and second signal pad electrodes 164A and 166A to be alignedwith accuracy.

Referring back to FIG. 22, the center C1 of the first region 41A of thefirst signal lead 124A (the second signal lead 126A) is offset in adirection away from the daughterboard 5A (in the Z1 direction) relativeto the center C2 of the first region 42A of the corresponding firstsignal pad electrode 164A (the corresponding second signal pad electrode166A). That is, the conductive layer (solder layer) 17A is formed tohave its contact surface with the first signal lead 124A (the secondsignal lead 126A) offset in a direction away from the daughterboard 5A(in the Z1 direction) relative to its contact surface with the wiringboard 11A (the signal pad electrode 164A or 166A). Accordingly, theconductive layer (solder layer) 17 has a substantiallyparallelogram-shaped cross section along the X-Z plane as illustrated inFIG. 22, for example.

Reheating the conductive layer (solder layer) 17A in this state causesthe conductive layer 17A to melt to take a shape reduced in surface area(that is, a shape having a rectangular cross section) because of itssurface tension.

If the second region 45A and the third region 47A of lower solderwettability were not present or formed to have the first region 41A tocome into surface contact with the conductive layer 17A interposedbetween them, the molten conductive layer 17A would move on the firstsignal lead 124A (the second signal lead 126A) in the Z1-Z2 directionsto reduce its surface area. Further, if the second regions 44A of lowersolder wettability were not present or formed to have the first region42A to come into surface contact with the conductive layer 17Ainterposed between them, the molten conductive layer 17A would move onthe wiring board 11A (the first signal pad electrode 164A or secondsignal pad electrode 166A) in the Z1-Z2 directions to reduce its surfacearea.

According to this embodiment, the second region 45A and the third region47A are provided to have the first region 41A to come into surfacecontact with the conductive layer 17A sandwiched between them, and thesecond regions 44A are provided to have the first region 42A to comeinto surface contact with the conductive layer 17A sandwiched betweenthem. This prevents the molten conductive layer (solder layer) 17A frommoving on the first signal lead 124A (the second signal lead 126A) orthe wiring board 11A (the first signal pad electrode 164A or secondsignal pad electrode 166A) in the Z1-Z2 directions. Accordingly, themolten conductive layer (solder layer) 17A causes the first signal lead124A (the second signal lead 126A) to move in a direction to approachthe daughterboard 5A relative to the wiring board 11A in order to reducethe surface area of the conductive layer 17A. This makes it possible tourge the first signal lead 124A (the second signal lead 126A) toward thedaughterboard 5A and ensure the connection of the first signal lead 124A(the second signal lead 126A) to the daughterboard 5A when theconductive layer 17A melts.

Further, according to this embodiment, the second region 45A of lowersolder wettability is between the first region 41A to come into surfacecontact with the conductive layer (solder layer) 17A and the fourthregion 43A to come into surface contact with the daughterboard 5A.Accordingly, the molten conductive layer 17A is prevented from moving onthe first signal lead 124A (the second signal lead 126A) in the Z2direction and coming into contact with the daughterboard 5A. This makesit possible to prevent the molten conductive layer 17A from adverselyaffecting the joining of the first signal lead 124A (the second signallead 126A) and the daughterboard 5A.

Further, according to this embodiment, as illustrated in FIG. 15, theinsulating layer 112A (third region) of low solder wettability ispresent on both lateral sides (Y1 and Y2 sides) of the first region 42Ato come into surface contact with the conductive layer (solder layer)17A. This prevents the molten conductive layer 17A from moving on thewiring board 11A in the Y1-Y2 directions. As a result, it is possible toprevent adjacent pad electrodes 16A from being electrically connected.

FIGS. 24A and 24B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 24A,respectively, of part of the jack connector 3A and the daughterboard 5A,illustrating placement of the jack connector 3A on the daughterboard 5A.In FIG. 24B, the adhesive agent 19A and the daughterboard 5A are omittedfor convenience of graphical representation.

The adhesive agent 19A for adhering (bonding) the first and secondsignal leads 124A and 126A to the daughterboard 5A is provided on thedaughterboard 5A. The adhesive agent 19A may be a solder paste higher inmelting point than the conductive layers (solder layer) 17A. Examples ofthe adhesive agent 19A include a Sn—Ag—Cu alloy having a melting pointof 220° C. In the case illustrated in FIGS. 24A and 24B, there is a gapbetween some of the first and second signal leads 124A and 126A and theadhesive agent (solder paste) 19A due to the (surface) warpage of thedaughterboard 5A.

FIGS. 25A and 25B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 25A,respectively, of part of the jack connector 3A and the daughterboard 5Aafter heating the structure of FIGS. 24A and 24B, illustrating amounting structure of the jack connector 3A. In FIG. 25B, the adhesiveagent 19A and the daughterboard 5A are omitted for convenience ofgraphical representation.

When the adhesive agent (solder paste) 19A is caused to melt byapplication of heat, the conductive layers (solder layers) 17A melt toallow the first and second signal leads 124A and 126A to move inside thecorresponding guide grooves 132A. In this state, the surface tension ofthe molten conductive layers 17A causes the first and second signalleads 124A and 126A to be pushed out of the corresponding guide grooves132A in the Z2 direction so as to absorb the (surface) warpage of thedaughterboard 5A. As a result, even in the case where the positionalrelationship between the wiring boards 11A and the daughterboard 5A ismaintained by reinforcement by such members as the ground leads 128A, itis possible to ensure the connection of the first and second signalleads 124A and 126A to the daughterboard 5A after the heat treatment, sothat it is possible to increase the reliability of the electrical andmechanical connections of the first and second signal leads 124A and126A to the daughterboard 5A.

Further, according to the above-described configuration, the secondregion 45A of lower solder wettability is formed between the firstregion 41A to come into contact with the conductive layer 17A and thefourth region 43A to come into contact with the adhesive agent (solderpaste) 19A. Accordingly, it is possible to prevent the interdiffusion ofthe liquid melt of the conductive layer 17A and the liquid melt of theadhesive agent 19A by separating the liquid melts from each other. Thismakes it possible to maintain the compositions of the conductive layer17A and the adhesive agent 19A and thus to obtain a target or desiredjoining strength and durability after heat treatment, so that it ispossible to increase the reliability of the mechanical connection of thefirst and second signal leads 124A and 126A and the daughterboard 5A.

Next, a description is given of a configuration of the plug connector2A.

FIG. 26 is a schematic cross-sectional view of the plug connector 2A.FIG. 27 is an enlarged view of a region indicated by box A in FIG. 26.FIG. 28 is a perspective view of the insulative housing 8A of the plugconnector 2A.

The plug connector 2A includes the insulative housing 8A, wiring boards21A having multiple pad electrodes 26A, multiple leads 22A, andconductive layers 27A provided between the pad electrodes 26A and theleads 22A.

The insulative housing 8A is configured to be fit to the firstinsulative housing 6A of the jack connector 3A. Multiple plug-sidecontacts (not graphically illustrated) are arranged in rows (the X1-X2directions) and columns (the Z1-Z2 directions) inside the insulativehousing 8A. The first insulative housing 6A is fit into the insulativehousing 8A so that the plug-side contacts are inserted into the firstinsulative housing 6A through the corresponding openings 62A to beconnected to the corresponding jack-side contacts 15A, therebyestablishing an electrical connection between the jack connector 3A andthe plug connector 2A (FIG. 8 and FIG. 9).

Further, as illustrated in FIG. 26, the insulative housing 8A supportsthe wiring boards 21A parallel to each other. For example, theinsulative housing 8A includes multiple slits 82A as illustrated in FIG.28. The slits 82A are aligned in the X1-X2 directions. The wiring boards21A are incorporated into the corresponding slits 82A on a one-to-onebasis. Thus, the insulative housing 8A has the function of the secondinsulative housing 7A in the jack connector 3A.

Further, as illustrated in FIG. 27 and FIG. 28, the insulative housing8A includes multiple guide grooves 84A extending in the directions(Y1-Y2 directions) in which the leads 22A extend. The leads 22A arefixed to the corresponding pad electrodes 26A through the correspondingconductive layers 27A, and are movable inside the corresponding guidegrooves 84A when the conductive layers 27A melt. Thus, the insulativehousing 8A also has the function of the spacer (guide part) 13A in thejack connector 3A.

The insulative housing 8A further includes through holes 86A. Asillustrated in FIG. 28, the through holes 86A formed through the X1 sideof the insulative housing 8A and the through holes 86A formed throughthe X2 side of the insulative housing 8A are aligned in the X1-X2directions. On the other hand, each wiring board 21A includes a pair ofthrough holes 216A (FIG. 26) corresponding to the through holes 86A.When the wiring boards 21A are incorporated into the insulative housing8A and rod members 88A are inserted through the through holes 86A andthe through holes 216A and attached to the wiring boards 21A at thethrough holes 86A and the through holes 216A, the wiring boards 21A areconnected to the insulative housing 8A.

The insulative housing 8A further includes fixation metal parts 81A(FIG. 8). For example, the fixation metal parts 81A are formed bybending a metal plate into an L-letter shape. The fixation metal parts81A have their respective first ends press-fit into and fixed to theinsulative housing 8A. The fixation metal parts 81A have theirrespective second ends mounted on the surface of the backplane (externalboard) 4A by, for example, soldering when the leads 22A are connected tothe backplane 4A. Thus, the insulative housing 8A is attached to thebackplane 4A through the fixation metal parts 81A.

Accordingly, the mechanical connection of the wiring boards 21A and thebackplane 4A is reinforced by the insulative housing 8A and a connectionmechanism formed of the through holes 86A, the through holes 216A, andthe rod members 88A. Therefore, even when an external stress such asvibration or impact is applied to the plug connector 2A or the backplane4A, the movements of the wiring boards 21A and the backplane 4A relativeto each other are limited or prevented, so that the deformation of theleads 22A connecting the wiring boards 21A and the backplane 4A iscontrolled. As a result, transmission of the external stress to theconnections of the leads 22A and the backplane 4A is controlled, so thatthe degradation of the connections, such as occurrence of peeling or acrack in a soldering part, is controlled, thus resulting in increaseddurability against the external stress.

As illustrated in FIG. 27, each of the pad electrodes 26A (includingfirst and second signal pad electrodes and ground pad electrodes)includes a first region 242A to come into contact with the correspondingconductive layer 27A; and two second regions 244A one on each side ofthe first region 242A in the directions in which the leads 22A extend(the Y1-Y2 directions) so that the first region 242A is sandwichedbetween the second regions 244A. The second regions 244A are lower inwettability with respect to the liquid melt of the conductive layer 27Athan the first region 242A. That is, each of the pad electrodes 26Aincludes a low wettability region (the second region 244A), a highwettability region (the first region 242A), and a low wettability region(the second region 244A) in this order in the Y1 direction from the Y2side.

Each wiring board 21A has an insulating layer (not graphicallyillustrated) on both lateral sides (Z1and Z2 sides) of the padelectrodes 26A. The insulating layer serves as a third region having lowwettability with respect to the liquid melt (molten solder) of theconductive layers 27A compared with the pad electrodes 26A.

The conductive layers 27A may be formed of, for example, solder such asa Sn—Bi alloy having a melting point of approximately 140° C. In thiscase, the first regions 242A may be formed of a metal having high solderwettability, while the second regions 244A may be formed of a metalhaving low solder wettability, resin, or an oxide coating. Anyappropriate method may be employed to form such regions different inwettability. Such a method uses, for example, photolithography andetching the same as in the case of the first and second signal padelectrodes 164A and 166A. For example, the method illustrated in FIGS.16A through 16D, FIGS. 17A through 17C, FIGS. 18A and 18B, or FIGS. 19Athrough 19D may be employed.

The leads 22A, which are for electrically connecting the wiring boards21A to the backplane 4A, extend in the Y1-Y2 directions. The leads 22Aare formed by bending a metal plate of phosphor bronze or a Fe-42Nialloy into an L-letter shape and processing it.

Each of the leads 22 (including first and second signal leads and groundleads) has a first region 241A to come into contact with thecorresponding conductive layer 27A; and a second region 245A on thebackplane 4A side (Y1 side) of the first region 241A. The second region245A is lower in wettability with respect to the liquid melt of theconductive layer 27A than the first region 241A.

Each of the leads 22A may further include a third region 247A across thefirst region 241A from the second region 245A. The third region 247A islower in wettability with respect to the liquid melt of the conductivelayer 27A than the first region 241A.

Each of the leads 22A may further include a fourth region 243A to comeinto contact with an adhesive agent (not graphically illustrated) forbonding the leads 22A to the backplane 4A on the backplane 4A side (Y1side) of the second region 245A. The fourth region 243A is higher inwettability with respect to the liquid melt of the adhesive agent thanthe second region 245A. In other words, the second region 245A is lowerin wettability with respect to the liquid melt of the adhesive agentthan the fourth region 243A.

Accordingly, in the case illustrated in FIG. 27, the lead 22A includes alow wettability region (the third region 247A), a high wettabilityregion (the first region 241A), a low wettability region (the secondregion 245A), and a high wettability region (the fourth region 243A) inthis order in the Y1 direction from the Y2 side.

Each of the first, second, third, and fourth regions 241A, 245A, 247A,and 243A may be provided on each of the X1, X2, Z1, and Z2 sides of theleads 22A so as to define their peripheral surfaces.

Referring to FIG. 27, the conductive layer 27A may be formed of, forexample, solder. In this case, the first region 241A and the fourthregion 243A are formed of a metal having high solder wettability, whilethe second region 245A and the third region 247A are formed of a metalhaving low solder wettability, resin, or an oxide coating. Anyappropriate method may be employed to form such regions different inwettability. Such a method uses, for example, photolithography andetching the same as in the case of the first and second signal padelectrodes 164A and 166A. For example, the method illustrated in FIGS.16A through 16D, FIGS. 17A through 17C, FIGS. 18A and 18B, or FIGS. 19Athrough 19D may be employed.

Referring to FIG. 27, the center D1 of the first region 241A of the lead22A is offset in a direction away from the backplane 4A (in the Y2direction) relative to the center D2 of the first region 242A of thecorresponding signal pad electrode 26A. That is, the conductive layer(solder layer) 27A is formed to have its contact surface with the lead22A offset in a direction away from the backplane 4A (in the Y2direction) relative to its contact surface with the wiring board 21A(the pad electrode 26A). Accordingly, the conductive layer (solderlayer) 27 has a substantially parallelogram-shaped cross section alongthe X-Y plane as illustrated in FIG. 27, for example.

Reheating the conductive layer (solder layer) 27A in this state causesthe conductive layer 27A to melt to take a shape reduced in surface area(that is, a shape having a rectangular cross section) because of itssurface tension.

If the second region 245A and the third region 247A of lower solderwettability were not present or formed to have the first region 241A tocome into surface contact with the conductive layer 27A interposedtherebetween, the molten conductive layer 27A would move on the lead 22Ain the Y1-Y2 directions to reduce its surface area. Further, if thesecond regions 244A of lower solder wettability were not present orformed to have the first region 242A to come into surface contact withthe conductive layer 27A interposed between them, the molten conductivelayer 27A would move on the wiring board 21A (the pad electrode 26A) inthe Y1-Y2 directions to reduce its surface area.

According to this embodiment, the second region 245A and the thirdregion 247A are provided to have the first region 241A to come intosurface contact with the conductive layer 27A sandwiched between them,and the second regions 244A are provided to have the first region 242Ato come into surface contact with the conductive layer 27A sandwichedbetween them. This prevents the molten conductive layer (solder layer)27A from moving on the lead 22A or the wiring board 21A (the padelectrode 26A) in the Y1-Y2 directions. Accordingly, the moltenconductive layer (solder layer) 27A causes the lead 22A to move in adirection to approach the backplane 4A relative to the wiring board 21Ain order to reduce the surface area of the conductive layer 27A. Thismakes it possible to urge the lead 22A toward the backplane 4A andensure the connection of the lead 22A to the backplane 4A when theconductive layer 27A melts.

Further, according to this embodiment, the second region 245A of lowersolder wettability is between the first region 241A to come into surfacecontact with the conductive layer (solder layer) 27A and the fourthregion 243A to come into surface contact with the backplane 4A.Accordingly, the molten conductive layer 27A is prevented from moving onthe lead 22A in the Y1 direction and coming into contact with thebackplane 4A. This makes it possible to prevent the molten conductivelayer 27A from adversely affecting the joining of the lead 22A and thebackplane 4A.

Further, according to this embodiment, as described above, an insulatinglayer of low solder wettability (third region) (not graphicallyillustrated) is present on both lateral sides (Z1 and Z2 sides) of thefirst region 242A to come into surface contact with the conductive layer(solder layer) 27A. This prevents the molten conductive layer 27A frommoving on the wiring board 21A in the Z1-Z2 directions. As a result, itis possible to prevent the molten conductive layer 27A from electricallyconnecting adjacent pad electrodes 26A.

The present invention is not limited to this embodiment, and variationsand modifications may be made without departing from the scope of thepresent application.

For example, in this embodiment, the fixation metal parts 71A and 81Ahave L-letter shapes and are configured to be surface-mounted on thedaughterboard 5A and the backplane 4A, respectively, as illustrated inFIG. 9 and FIG. 8, but the present invention is not limited to thisconfiguration. For example, the fixation metal parts 71A may have a rodshape and be configured to be press-fit into corresponding through holesof the daughterboard 5A or to be inserted into corresponding throughholes of the daughterboard 5A and soldered to the daughterboard 5A atthe through holes.

Further, in this embodiment, the projecting parts 182A have an L-lettershape and are configured to be surface-mounted on the daughterboard 5Aby soldering as illustrated in FIG. 13, but the present invention is notlimited to this configuration. For example, the projecting parts 182Amay have a rod shape and be configured to be press-fit intocorresponding through holes of the daughterboard 5A or to be insertedinto corresponding through holes of the daughterboard 5A and soldered tothe daughterboard 5A at the through holes.

Further, according to this embodiment, the second insulative housing 7Ahas the projecting parts 78A and the wiring boards 11A has the recessparts 118A so that the second insulative housing 7A and the wiringboards 11A are connected with the projecting parts 78A fit into thecorresponding recess parts 118A as illustrated in FIG. 10 through FIG.12, but the present invention is not limited to this configuration. Thatis, the second insulative housing 7A may have recess parts and thewiring boards 11A have projecting parts so that the second insulativehousing 7A and the wiring boards 11A are connected with the projectingparts fit into the corresponding recess parts.

Further, according to this embodiment, as illustrated in FIG. 10 throughFIG. 13, the mechanical connection of the wiring boards 11A and thedaughterboard 5A in the jack connector 3A may be reinforced withconfigurations or reinforcement members such as the second insulativehousing and a connection mechanism formed of the projecting parts 78Aand the recess parts 118A; the projecting parts 182A; and the groundleads 128A. However, the jack connector 3A is not limited to thisconfiguration, and does not have to have all of such reinforcementmembers and may be provided with one of the above-describedreinforcement members.

Further, according to this embodiment, the ground leads 128A areconfigured to be press-fit into the corresponding through holes 54A ofthe daughterboard 5A as illustrated in FIG. 24A and FIG. 25A, but thepresent invention is not limited to this configuration.

FIGS. 29A and 29B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 29A,respectively, of part of a jack connector 3A′ and a daughterboard(external board) 5A′ according to a first variation of this embodiment.In FIG. 29B, the adhesive agent 19A and the daughterboard 5A′ areomitted for convenience of graphical representation.

By way of example, as illustrated in FIG. 29A, ground leads 128A′ have arod shape and are inserted into and soldered to corresponding throughholes 54A′ of the daughterboard 5A′. In this case, soldering parts 19A′form fillets on both sides (Z1 side and Z2 side) of the daughterboard5A′. Therefore, compared with the case of surface mounting where thesoldering parts 19A′ would form fillets only on one side (Z1 side) ofthe daughterboard 5A′, the mechanical connection of the wiring boards ofthe jack connector 3A′ and the daughterboard 5A′ is further reinforced.As a result, even when an external stress such as vibration or impact isapplied to the jack connector 3A′ or the daughterboard 5A′, themovements of the wiring boards of the jack connector 3A′ and thedaughterboard 5A′ relative to each other are limited or prevented, sothat the deformation of the leads 12A connecting the wiring boards 11Aand the daughterboard 5A′ is controlled. As a result, transmission ofthe external stress to the connections of the leads 124A and 126A andthe daughterboard 5A′ is controlled, so that the degradation of theconnections, such as occurrence of peeling or a crack in the solderingparts 19A′, is controlled, thus resulting in further increaseddurability against the external stress.

Further, according to this embodiment, the plug connector 2A may bereinforced with configurations or reinforcement members such as theinsulative housing 8A and a connection mechanism formed of the throughholes 86A, the through holes 216A, and the rod members 88A.Alternatively, the plug connector 2A may replace the above-describedreinforcement member with another configuration or reinforcement memberor include another configuration or reinforcement member in addition tothe above-described reinforcement member.

Further, according to this embodiment, the conductive layers 17A may beformed of solder. The conductive layers 17A are not limited toparticular types of materials and may be formed of any material as longas the conductive layers 17A are meltable at the time of bonding theleads 12A to the daughterboard 5A. For example, the conductive layers17A may be formed of a metal other than solder, such as In having amelting point of approximately 160° C. Further, the starting material ofthe conductive layers 17A may be in the form of either paste or foil.

Further, according to this embodiment, the conductive layers 17A have alower melting point than the adhesive agent 19A for bonding the leads12A to the daughterboard 5A. However, the conductive layers 17A have ahigher melting point than the adhesive agent 19A as long as theconductive layers 17A are meltable at the time of bonding the leads 12Ato the daughterboard 5A.

Further, according to this embodiment, solder is used for the adhesiveagent 19A. However, the adhesive agent 19A is not limited to particulartypes. For example, an anisotropic conductive film (ACF) formed of amixture of thermosetting resin and metal particulates, or a metal otherthan solder may be used for the adhesive agent 19A. The adhesive agent19A may be in the form of either paste or foil.

Next, a description is given of a second variation according to thisembodiment.

In this second variation, the same elements as those described above arereferred to by the same reference numerals, and a description thereof issuitably omitted.

FIG. 30 is an exploded perspective view of the jack connector 3Aaccording to the second variation.

FIG. 31 is a cut-away view of the jack connector 3A for illustrating theengagement relationship among the first insulative housing 6A, thesecond insulative housing 7A, and the modules 10A thereof according tothe second variation.

FIG. 32 is a perspective view of the wiring board 11A, illustrating aconfiguration thereof according to the second variation.

FIG. 33 is a perspective view of the wiring board 11A, illustrating amethod of joining (connecting) the leads 12A and the pad electrodes 16Aaccording to the second variation.

The jack connector 3A according to the second variation basically hasthe same configuration as the jack connector 3A of the first embodiment,but may be different from the jack connector 3A of the first embodimentas follows.

Referring to FIG. 30 through FIG. 33, unlike in the first embodiment,the ground leads 128A have the same shape and configuration as the firstand second signal leads 124A and 126A, and the conductive layers 17A areprovided between the pad electrodes 16A and the corresponding leads 12A.Further, the wiring board 11A does not include the projecting parts182A.

Referring to FIG. 32 as well as FIG. 15, the ground pad electrodes 168Aare electrically connected to the backside metal plate 111A via thecorresponding through holes 115A formed through the insulating layer112A. The ground pad electrodes 168A alternate with the signal padelectrode pairs 162A so as to reduce crosstalk between adjacent signalpad electrode pairs 162A.

Further, the ground pad electrodes 168A have the same configuration asthe first and second signal pad electrodes 164A and 166A as illustratedin FIG. 15. That is, the ground pad electrodes 168A may have arectangular shape similar to those of the first and second signal padelectrodes 164A and 166A as illustrated in FIG. 15. Each of the groundpad electrodes 168A as well as the first and second signal padelectrodes 164A and 166A includes the first region 42A to come intocontact with the corresponding conductive layer 17A; and the two secondregions 44A one on each side of the first region 42A in the directions(Z1-Z2 directions) in which the leads 12A extend so that the firstregion 42A is sandwiched between the second regions 44A. The secondregions 44A are lower in wettability with respect to the liquid melt ofthe conductive layer 17A than the first region 42A. That is, each of theground pad electrodes 168A as well as the first and second signal padelectrodes 164A and 166A includes a low wettability region (the secondregion 44A), a high wettability region (the first region 42A), and a lowwettability region (the second region 44A) in this order in the Z2direction from the Z1 side.

The wiring board 11A has the insulating layer 112A on both lateral sides(Y1 and Y2 sides) of the pad electrodes 16A. The insulating layer 112Aserves as a third region having low wettability with respect to theliquid melt (molten solder) of the conductive layers 17A compared withthe pad electrodes 16A.

The conductive layers 17A may be formed of, for example, solder. In thiscase, the first regions 42A may be formed of a metal having high solderwettability, while the second regions 44A may be formed of a metalhaving low solder wettability, resin, or an oxide coating. Anyappropriate method may be employed to form such regions different inwettability. Such a method uses, for example, photolithography andetching the same as in the case of the first and second signal padelectrodes 164A and 166A in the first embodiment. For example, themethod illustrated in FIGS. 16A through 16D, FIGS. 17A through 17C,FIGS. 18A and 18B, or FIGS. 19A through 19D may be employed to formregions different in wettability in the ground pad electrodes 168A aswell as in the first and second signal pad electrodes 164A and 166A inthis variation.

As described above, the ground leads 128A have the same shape andconfiguration as the first and second signal leads 124A and 126A asillustrated in FIGS. 20A and 20B.

The leads 12A including the ground leads 128A are formed by bending ametal plate of phosphor bronze or a Fe-42Ni alloy into an L-letter shapeand processing it.

Each of the leads 12A including the ground leads 128A includes the firstregion 41A to come into contact with the corresponding conductive layer17A; and the second region 45A on the daughterboard 5A side (Z2 side) ofthe first region 41A. The second region 45A is lower in wettability withrespect to the liquid melt of the conductive layer 17A than the firstregion 41A.

Each of the leads 12A including the ground leads 128A may furtherinclude the third region 47A across the first region 41A from the secondregion 45A. The third region 47A is lower in wettability with respect tothe liquid melt of the conductive layer 17A than the first region 41A.

Each of the leads 12A including the ground leads 128A may furtherinclude the fourth region 43A to come into contact with the adhesiveagent 19A (FIG. 34A) on the daughterboard 5A side (Z2 side) of thesecond region 45A. The adhesive agent 19A adheres the leads 12A to thedaughterboard 5A. The fourth region 43A is higher in wettability withrespect to the liquid melt of the adhesive agent 19A than the secondregion 45A. In other words, the second region 45A is lower inwettability with respect to the liquid melt of the adhesive agent 19Athan the fourth region 43A.

Accordingly, each of the leads 12A including the ground leads 128Aincludes a low wettability region (the third region 47A), a highwettability region (the first region 41A), a low wettability region (thesecond region 45A), and a high wettability region (the fourth region43A) in this order in the Z2 direction from the Z1 side.

As illustrated in FIGS. 20A and 20B, each of the first, second, third,and fourth regions 41A, 45A, 47A, and 43A may be provided on each of theX1, X2, Y1, and Y2 sides of the leads 12A including the ground leads128A so as to define their peripheral surfaces.

Referring to FIG. 33, which illustrates a method of joining (connecting)the leads 12A and the pad electrodes 16A according to the secondvariation, the leads 12A are held at predetermined intervals by the endplate 192A. The leads 12A and the end plate 192A are formed as a unitarystructure by processing a metal plate of phosphor bronze or a Fe-42Nialloy into a comb shape by blanking. The end plate 192A includes thethrough holes 196A corresponding to the through holes 116A provided inthe wiring board 11A.

According to the joining method illustrated in FIG. 33, first, a solderpaste (not graphically illustrated) such as a Sn—Bi alloy having amelting point of approximately 140° C. is applied on the pad electrodes16A including the ground pad electrodes 168A. The area of application ofthe solder paste may correspond to the first regions 42A (FIG. 15) ofthe pad electrodes 16A and the first regions 41A (FIGS. 20A and 20B) ofthe corresponding leads 12A. In this case, it is ensured that the solderpaste melted by below-described heat treatment spreads over and wetsboth of the first regions 42A and the first regions 41A whilecontracting in volume to crush air gaps inside the solder paste.Further, in this case, the molten solder paste moves from the secondregions 44A and 45A of lower solder wettability to the first regions 42Aand 41A, respectively, of higher solder wettability.

After application of the solder paste, pins (not graphicallyillustrated) are inserted through the through holes 116A and the throughholes 196A after aligning the through holes 116A and the through holes196A. Thereby, the pad electrodes 16A and the corresponding leads 12Aare aligned.

Next, the solder paste is melted by heat treatment and then solidifiedto form the conductive layers (solder layers) 17A. As a result, theleads 12A are connected to the corresponding pad electrodes 16A throughthe conductive layers 17A. Then, the pins are removed and the end plate192A is broken off.

The positional relationship between the leads 12A and the correspondingpad electrodes 16A is the same as that of the first signal lead 124A(the second signal lead 126A) and the first signal pad electrode 164A(the second signal pad electrode 166A) as illustrated in FIG. 22.

The spacer 13A (FIGS. 23A and 23B) is fixed to the wiring board 11A. Thespacer 13A has the guide grooves 132A on its surface (X1-side surface)facing the wiring board 11A. The leads 12A including the ground leads128A are movable inside the corresponding guide grooves 132A when theconductive layers (solder layers) 17A melt.

As described above, the projecting parts 136A of the spacer 13A are fitinto the corresponding recess parts 117A of the wiring board 11A, sothat the spacer 13A and the wiring board 11A are connected. This allowsthe guide grooves 132A and the pad electrodes 16A to be aligned withaccuracy.

According to this variation, the same as illustrated in FIG. 22, thecenter C1 of the first region 41A of the lead 12A is offset in adirection away from the daughterboard 5A (in the Z1 direction) relativeto the center C2 of the first region 42A of the corresponding padelectrode 16A. That is, the conductive layer (solder layer) 17A isformed to have its contact surface with the lead 12A offset in adirection away from the daughterboard 5A (in the Z1 direction) relativeto its contact surface with the wiring board 11A (the pad electrode16A). Accordingly, the conductive layer (solder layer) 17A has asubstantially parallelogram-shaped cross section along the X-Z plane asillustrated in FIG. 22, for example.

Reheating the conductive layer (solder layer) 17A in this state causesthe conductive layer 17A to melt to take a shape reduced in surface area(that is, a shape having a rectangular cross section) because of itssurface tension.

If the second region 45A and the third region 47A of lower solderwettability were not present or formed to have the first region 41A tocome into surface contact with the conductive layer 17A interposedbetween them, the molten conductive layer 17A would move on the lead 12Ain the Z1-Z2 directions to reduce its surface area. Further, if thesecond regions 44A of lower solder wettability were not present orformed to have the first region 42A to come into surface contact withthe conductive layer 17A interposed between them, the molten conductivelayer 17A would move on the wiring board 11A (the pad electrode 16A) inthe Z1-Z2 directions to reduce its surface area.

According to this variation, the second region 45A and the third region47A are provided to have the first region 41A to come into surfacecontact with the conductive layer 17A sandwiched between them, and thesecond regions 44A are provided to have the first region 42A to comeinto surface contact with the conductive layer 17A sandwiched betweenthem. This prevents the molten conductive layer (solder layer) 17A frommoving on the lead 12A or the wiring board 11A (the pad electrode 16A)in the Z1-Z2 directions. Accordingly, the molten conductive layer(solder layer) 17A causes the lead 12A to move in a direction toapproach the daughterboard 5A relative to the wiring board 11A in orderto reduce the surface area of the conductive layer 17A. This makes itpossible to urge the lead 12A toward the daughterboard 5A and ensure theconnection of the lead 12A to the daughterboard 5A when the conductivelayer 17A melts.

Further, according to this variation, the second region 45A of lowersolder wettability is between the first region 41A to come into surfacecontact with the conductive layer (solder layer) 17A and the fourthregion 43A to come into surface contact with the daughterboard 5A.Accordingly, the molten conductive layer 17A is prevented from moving onthe lead 12A in the Z2 direction and coming into contact with thedaughterboard 5A. This makes it possible to prevent the moltenconductive layer 17A from adversely affecting the joining of the lead12A and the daughterboard 5A.

Further, according to this variation, the same as illustrated in FIG.15, the insulating layer 112A (third region) of low solder wettabilityis present on both lateral sides (Y1 and Y2 sides) of the first region42A to come into surface contact with the conductive layer (solderlayer) 17A. This prevents the molten conductive layer 17A from moving onthe wiring board 11A in the Y1-Y2 directions. As a result, it ispossible to prevent the molten conductive layer 17A from electricallyconnecting adjacent pad electrodes 16A.

FIGS. 34A and 34B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 34A,respectively, of part of the jack connector 3A and the daughterboard 5A,illustrating placement of the jack connector 3A on the daughterboard 5Aaccording to this variation. In FIG. 34B, the adhesive agent 19A and thedaughterboard 5A are omitted for convenience of graphicalrepresentation.

The adhesive agent 19A for adhering (bonding) the leads 12A to thedaughterboard 5A is provided on the daughterboard 5A. The adhesive agent19A may be a solder paste higher in melting point than the conductivelayers (solder layer) 17A. Examples of the adhesive agent 19A include aSn—Ag—Cu alloy having a melting point of 220° C. In the case illustratedin FIGS. 34A and 34B, there is a gap between some of the leads 12A andthe adhesive agent (solder paste) 19A due to the (surface) warpage ofthe daughterboard 5A.

FIGS. 35A and 35B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 35A,respectively, of part of the jack connector 3A and the daughterboard 5Aafter heating the structure of FIGS. 34A and 34B, illustrating amounting structure of the jack connector 3A. In FIG. 35B, the adhesiveagent 19A and the daughterboard 5A are omitted for convenience ofgraphical representation.

When the adhesive agent (solder paste) 19A is caused to melt byapplication of heat, the conductive layers (solder layers) 17A melt toallow the leads 12A to move inside the corresponding guide grooves 132A.In this state, the surface tension of the molten conductive layers 17Acauses the leads 12A to be pushed out of the corresponding guide grooves132A in the Z2 direction so as to absorb the (surface) warpage of thedaughterboard 5A. As a result, it is possible to ensure the connectionof the leads 12A to the daughterboard 5A after the heat treatment, sothat it is possible to increase the reliability of the electrical andmechanical connections of the leads 12A to the daughterboard 5A.

Further, according to the above-described configuration, the secondregion 45A of lower solder wettability is formed between the firstregion 41A to come into contact with the conductive layer 17A and thefourth region 43A to come into contact with the adhesive agent (solderpaste) 19A. Accordingly, it is possible to prevent the interdiffusion ofthe liquid melt of the conductive layer 17A and the liquid melt of theadhesive agent 19A by separating the liquid melts from each other. Thismakes it possible to maintain the compositions of the conductive layer17A and the adhesive agent 19A and thus to obtain a target or desiredjoining strength and durability after heat treatment, so that it ispossible to increase the reliability of the mechanical connection of theleads 12A and the daughterboard 5A.

Next, a description is given of a configuration of the plug connector 2Aaccording to the second variation.

The plug connector 2A according to the second variation may have thesame configuration as that of the plug connector 2A according to thefirst embodiment. Alternatively, however, the plug connector 2Aaccording to the second variation may also have a configuration asillustrated in FIG. 36. The plug connector 2A illustrated in FIG. 36 hasthe same configuration as the plug connector 2A of FIG. 26 except thatthe plug connector 2A of FIG. 36 does not include the through holes 86A,the through holes 216A, and the rod members 88A.

FIG. 37 is a cut-away view of another jack connector 3B according to thesecond variation of the first embodiment.

FIG. 38 is a cross-sectional view of part of the jack connector 3B,illustrating the positional relationship between a lead 12B and acorresponding pad electrode 16B.

Unlike the jack connector 3A, the jack connector 3B includes a stack ofmultiple insulative plates 6B and a lid (not graphically illustrated)covering the X2 side of the stack. As illustrated in FIG. 37 and FIG.38, each insulative plate 6B includes a wiring board 11B having multiplepad electrodes 16B (FIG. 38); and multiple leads 12B. Conductive layers17B (FIG. 38) are provided between the pad electrodes 16B and thecorresponding leads 12B.

The insulative plates 6B and the lid include multiple guide grooves 132E(FIG. 38) on their respective rear faces (the X1-side faces). The guidegrooves 132B extend in the direction (the Z1-Z2 directions) in which theleads 12B extend on the rear side (X2 side) of the insulative plates 6Bor the lid. The leads 12B are fixed to the pad electrodes 16B throughthe conductive layers 17B, and are movable inside the correspondingguide grooves 132B when the conductive layers 17B melt.

Referring to FIG. 38, each of the pad electrodes 16B includes a firstregion 42B to come into contact with the corresponding conductive layer17B; and two second regions 44B one on each side of the first region 42Bin the directions (Z1-Z2 directions) in which the leads 12B extend sothat the first region 42B is sandwiched between the second regions 44B.The second regions 44B are lower in wettability with respect to theliquid melt of the conductive layer 17B than the first region 42B. Thatis, each of the pad electrodes 16B includes a low wettability region(the second region 44B), a high wettability region (the first region42B), and a low wettability region (the second region 44B) in this orderin the Z2 direction from the Z1 side.

The wiring board 11B has an insulating layer (not graphicallyillustrated) on both lateral sides (Y1 and Y2 sides) of the padelectrodes 16B. The insulating layer serves as a third region having lowwettability with respect to the liquid melt (molten solder) of theconductive layers 17B compared with the pad electrodes 16B.

The conductive layers 17B may be formed of, for example, solder such asa Sn—Bi alloy having a melting point of approximately 140° C. In thiscase, the first regions 42B may be formed of a metal having high solderwettability, while the second regions 44B may be formed of a metalhaving low solder wettability, resin, or an oxide coating. Anyappropriate method may be employed to form such regions different inwettability. Such a method uses, for example, photolithography andetching the same as in the case of the pad electrode 16A in the secondvariation. For example, the method illustrated in FIGS. 16A through 16D,FIGS. 17A through 17C, FIGS. 18A and 18B, or FIGS. 19A through 19D maybe employed.

Each of the leads 12B includes a first region 41B to come into contactwith the corresponding conductive layer 17B; and a second region 45B onan external board side (Z2 side) of the first region 41B. The secondregion 45B is lower in wettability with respect to the liquid melt ofthe conductive layer 17B than the first region 41B.

Each of the leads 12B may further include a third region 47B across thefirst region 41B from the second region 45B. The third region 47B islower in wettability with respect to the liquid melt of the conductivelayer 17B than the first region 41B.

Each of the leads 12B may further include a fourth region 43B to comeinto contact with an adhesive agent for adhering (bonding) the leads 12Bto the external board on the external board side (Z2 side) of the secondregion 45B. The fourth region 43B is higher in wettability with respectto the liquid melt of the adhesive agent than the second region 45B. Inother words, the second region 45B is lower in wettability with respectto the liquid melt of the adhesive agent than the fourth region 43B.

Accordingly, in the case illustrated in FIG. 38, each lead 12B includesa low wettability region (the third region 47B), a high wettabilityregion (the first region 41B), a low wettability region (the secondregion 45B), and a high wettability region (the fourth region 43B) inthis order in the Z2 direction from the Z1 side.

Each of the first, second, third, and fourth regions 41B, 45B, 47B, and43B may be provided on each of the X1, X2, Y1, and Y2 sides of the leads12B so as to define their peripheral surfaces.

The conductive layers 17B may be formed of, for example, solder. In thiscase, the first region 41B and the fourth region 43B are formed of ametal having high solder wettability, while the second region 45B andthe third region 47B are formed of a metal having low solderwettability, resin, or an oxide coating. Any appropriate method may beemployed to form such regions different in wettability. Such a methoduses, for example, photolithography and etching the same as in the caseof the pad electrodes 16A. For example, the method illustrated in FIGS.16A through 16D, FIGS. 17A through 17C, FIGS. 18A and 18B, or FIGS. 19Athrough 19D may be employed.

Referring to FIG. 38, the center E1 of the first region 41B of the lead12B is offset in a direction away from the external board (in the Z1direction) relative to the center E2 of the first region 42B of thecorresponding pad electrode 16B. That is, the conductive layer (solderlayer) 17B is formed to have its contact surface with the lead 12Boffset in a direction away from the external board (in the Z1 direction)relative to its contact surface with the wiring board 11A (the padelectrode 16B). Accordingly, the conductive layer (solder layer) 17B hasa substantially parallelogram-shaped cross section along the X-Z planeas illustrated in FIG. 38, for example.

Reheating the conductive layer (solder layer) 17B in this state causesthe conductive layer 17B to melt to take a shape reduced in surface area(that is, a shape having a rectangular cross section) because of itssurface tension.

If the second region 45B and the third region 47B of lower solderwettability were not present or formed to have the first region 41B tocome into surface contact with the conductive layer 17B interposedbetween them, the molten conductive layer 17B would move on the lead 12Bin the Z1-Z2 directions to reduce its surface area. Further, if thesecond regions 44B of lower solder wettability were not present orformed to have the first region 42B to come into surface contact withthe conductive layer 17B interposed between them, the molten conductivelayer 17B would move on the wiring board 11B (the pad electrode 16B) inthe Z1-Z2 directions to reduce its surface area.

According to the configuration illustrated in FIG. 37 and FIG. 38, thesecond region 45B and the third region 47B are provided to have thefirst region 41B to come into surface contact with the conductive layer17B sandwiched between them, and the second regions 44B are provided tohave the first region 42B to come into surface contact with theconductive layer 17B sandwiched between them. This prevents the moltenconductive layer (solder layer) 17B from moving on the lead 12B or thewiring board 11B (the pad electrode 16B) in the Z1-Z2 directions.Accordingly, the molten conductive layer (solder layer) 17B causes thelead 12B to move in a direction to approach the external board relativeto the wiring board 11B in order to reduce the surface area of theconductive layer 17B. This makes it possible to urge the lead 12B towardthe external board and ensure the connection of the lead 12B to theexternal board when the conductive layer 17B melts.

Further, according to the configuration illustrated in FIG. 37 and FIG.38, the second region 45B of lower solder wettability is between thefirst region 41B to come into surface contact with the conductive layer(solder layer) 17B and the fourth region 43B to come into surfacecontact with the external board. Accordingly, the molten conductivelayer 17B is prevented from moving on the lead 12B in the Z2 directionand coming into contact with the external board. This makes it possibleto prevent the molten conductive layer 17B from adversely affecting thejoining of the lead 12B and the external board.

Further, according to the configuration illustrated in FIG. 37 and FIG.38, an insulating layer (third region) of low solder wettability ispresent on both lateral sides (Y1 and Y2 sides) of the first region 42Bto come into surface contact with the conductive layer (solder layer)17B. This prevents the molten conductive layer 17B from moving on thewiring board 11B in the Y1-Y2 directions. As a result, it is possible toprevent the molten conductive layer 17B from electrically connectingadjacent pad electrodes 16B.

According to the second variation of the first embodiment, asillustrated in FIG. 31, the wiring board 11A may be connected to thesecond insulative housing 7A through the corresponding projecting part78A and the recess part 18A. Alternatively, the wiring board 11A may notbe connected to the second insulative housing 7A. In either case, it ispossible to urge the leads 12A toward the daughterboard 5A when theconductive layers 17A melt, so that it is possible to increase thereliability of the connection of the leads 12A and the daughterboard 5A.

Further, as described above with reference to FIG. 15, each of the firstand second signal electrodes 164A and 166A (first embodiment) or eachpad electrode 16A (second variation) includes the first region 42A andthe second regions 44A, but the present invention is not limited to thisconfiguration. For example, as illustrated in FIG. 39, a pad electrode16C may include a first region 42C (to come into contact with thecorresponding conductive layer 17A), and an insulating layer 112C (andan interconnection pattern 113C) may include second regions 44C on bothsides (Z1 and Z2 sides) of the pad electrode 16C. In general, the resinor ceramics insulating layer 112C is lower in solder wettability thanthe metal pad electrode 16C.

Further, as described above with reference to FIG. 21 or FIG. 33, thesolder paste provided between the first and second signal pad electrodes164A and 166A and the corresponding first and second signal leads 124Aand 126A (first embodiment) or between the pad electrodes 16A and thecorresponding leads 12A (second variation) is melted by heat treatmentand solidified to form the conductive layers (solder layers) 17A, butthe present invention is not limited to this configuration. For example,a solder layer may be formed on one or both of the first regions 41A and42A before providing the solder paste. Preforming such a solder layerfurther ensures that the solder melted by heat treatment spreads overand wets the first regions 41A and 42A.

Further, as described above with reference to FIG. 22, the conductivelayers 17A have a substantially parallelogram-shaped cross section alongthe X-Z plane, but the present invention is not limited to thisconfiguration. For example, the conductive layers 17A may have asubstantially trapezoidal shape. In this case, the cross-sectional shapeof the molten conductive layers 17A is caused to become an isoscelestrapezoid because of their surface tension.

Further, as described above with reference to FIG. 22, one conductivelayer 17A is provided between each of the first and second signal padelectrodes 164A and 166A and the corresponding first or second signallead 124A or 126A (first embodiment) or between each pad electrode 16Aand the corresponding lead 12A (second variation). However, the presentinvention is not limited to this configuration, and as illustrated inFIG. 40, multiple conductive layers 17D may be provided between one padelectrode (or signal pad electrode) 16D and a corresponding one lead (orsignal lead) 12D. In this case, the pad electrode 16D includes firstregions 42D and a fourth region 48D provided between the adjacent firstregions 42D, and the lead 12D includes first regions 41D and a fifthregion 49D provided between the adjacent first regions 41D. The fourthregion 48D and the fifth region 49D are lower in wettability withrespect to the liquid melt of the conductive layers 17D than the firstregions 42D and the first regions 41D, respectively. The centers F1 andG1 of the first regions 41D of the lead 12D is offset in a directionaway from an external board (in the Z1 direction) relative to thecenters F2 and G2, respectively, of the first region 42D of thecorresponding pad electrode 16D (a wiring board 11D).

Second Embodiment

A description is given of a second embodiment of the present invention.

FIG. 41 is a schematic diagram illustrating part of a module 10E, whichis a variation of the module 10A of the first embodiment. The module 10Emay replace the module 10A in the jack connector 3A of the firstembodiment.

FIG. 42 is a cross-sectional view of the structure of FIG. 41 takenalong one-dot chain line A-A.

Referring to FIG. 41 and FIG. 42, the module 10E includes a wiring board11E having multiple pad electrodes 16E; multiple leads 12E; multipleconductive layers 17E; and an insulative guide part 13E.

The leads 12E are configured to connect the wiring board 11Eelectrically to the daughterboard 5A (FIG. 8). The leads 12E areconnected to the corresponding pad electrodes 16E through thecorresponding conductive layers 17E. The guide part 13E is fixed ontothe wiring board 11E. The guide part 13E includes multiple guide grooves132E on its surfaces facing toward the wiring board 11E. The guidegrooves 132E extend in the directions (Z1-Z2 directions) in which theleads 12E extend. The leads 12E are movable inside the correspondingguide grooves 132E when the conductive layers 17E melt. That is, theguide part 13E guides the leads 12E in the directions (Z1-Z2 directions)in which the leads 12E extend when the conductive layers 17E melt. Theguide part 13E further includes window parts 134E. The window parts 134Eare formed near the guide grooves 132E. This allows the conductivelayers (solder layers) 17E to be heated from both ends (Z1 and Z2 ends)of the guide grooves 132E. This ensures that the conductive layers(solder layers) 17E are melted by heat treatment.

The wiring board 11E has a five-layer structure where an insulatinglayer 112E of polyimide or the like and interconnection patterns (wiringpatterns) 113E of Cu, Al, or the like are successively stacked on eachof the front (X2-side) surface and the rear (X1-side) surface of a metalplate 111E of phosphor bronze or the like. The metal plate 111E, whichis a ground plate for crosstalk prevention, prevents crosstalk betweenthe interconnection patterns 113E provided on both sides (X1and X2sides) of the metal plate 111E.

The wiring board 11E may be manufactured by a common method such as oneusing photolithography and etching.

FIGS. 43A through 43H are diagrams illustrating a method (process) formanufacturing the wiring board 11E.

In the illustrated case, first, as illustrated in FIG. 43A,photosensitive polyimide ink is applied and dried on one of the front(X2-side) and rear (X1-side) surfaces (the front surface in theillustrated case) of the phosphor bronze metal plate 111E, therebyforming the insulating layer 112E on the metal plate 111E.

Next, as illustrated in FIG. 43B, the insulating layer 112E is exposedand developed using a photomask (not graphically illustrated).

Next, as illustrated in FIG. 43C, a Ni—W film 51E is deposited (stacked)on the structure of FIG. 43B by sputtering.

Next, as illustrated in FIG. 43D, a Cu film 52E is deposited (stacked)on the Ni—W film 51E by electroplating.

Next, as illustrated in FIG. 43E, a photoresist pattern 53E is formed onthe Cu film 52E.

Next, as illustrated in FIG. 43F, the Cu film 52E and the Ni—W film 51Eare etched using the photoresist pattern 53E.

Next, as illustrated in FIG. 43G, the photoresist pattern 53E isremoved, so that the interconnection patterns 113E and pad electrodes16E are formed of the Cu film 52E.

Next, as illustrated in FIG. 43H, the insulating layer 112E, theinterconnection patterns 113E, and the pad electrodes 16E are formed onthe other one of the front (X2-side) and rear (X1-side) surfaces (therear surface in the illustrated case) of the phosphor bronze metal plate111E by repeating the above-described processes illustrated in FIGS. 43Athrough 43G.

As described above, the wiring board 11E of this embodiment has afive-layer structure where the insulating layer 112E and theinterconnection patterns 113E are successively stacked on each of thefront (X2-side) and rear (X1-side) surfaces of the metal plate 111E.Alternatively, the wiring board 11E may have a three-layer structurewhere the interconnection patterns 113E of Cu or the like are stacked oneach of the front (X2-side) and rear (X1-side) surfaces of theinsulating layer 112E of an insulating film of polyimide or the like.Further, a ground plate may be provided between adjacent wiring boards11E to reduce crosstalk. Further, the wiring board 11E may be eitherrigid or flexible.

Referring to FIG. 41, each pad electrode 16E is connected to one end ofthe corresponding interconnection pattern 113A. The multiple electrodes16E are provided on each of the front (X2-side) and rear (X1-side)surfaces of the wiring board 11E. Each of the pad electrodes 16Eincludes a first region 42E to come into contact with the correspondingconductive layer 17E; and two second regions 44E one on each side of thefirst region 42E in the directions (Z1-Z2 directions) in which the leads12E extend so that the first region 42E is sandwiched between the secondregions 44E. The second regions 44E are lower in wettability withrespect to the liquid melt of the conductive layer 17E than the firstregion 42E. That is, each pad electrode 16E includes a low wettabilityregion (the second region 44E), a high wettability region (the firstregion 42E), and a low wettability region (the second region 44E) inthis order in the Z2 direction from the Z1 side.

Referring to FIG. 41, the wiring board 11E has the insulating layer 112Eon both lateral sides (Y1 and Y2 sides) of the pad electrode 16E. Theinsulating layer 112E serves as a third region having low wettabilitywith respect to the liquid melt (molten solder) of the conductive layer17E compared with the pad electrode 16E.

The conductive layers 17E may be formed of, for example, solder such aslead-free solder. In this case, the first regions 42E may be formed of ametal having high solder wettability, while the second regions 44E maybe formed of a metal having low solder wettability, resin, or an oxidecoating. Any appropriate method may be employed to form such regionsdifferent in wettability. Such a method uses, for example,photolithography and etching the same as in the case of the first andsecond signal pad electrodes 164A and 166A (first embodiment). Forexample, the method illustrated in FIGS. 16A through 16D, FIGS. 17Athrough 17C, FIGS. 18A and 18B, or FIGS. 19A through 19D may beemployed. In this embodiment, such a method may be performed on the Cupad electrodes 16E formed in the process of FIG. 43G or 43H.

The leads 12E are configured to connect the wiring board 11Eelectrically to the daughterboard 5A, and extend in the Z1-Z2directions. The leads 12E are formed by bending a metal plate ofphosphor bronze or a Fe-42Ni alloy into an L-letter shape and processingit. The multiple leads 12E are provided on each of the front (X2-side)and rear (X1-side) surfaces of the wiring board 11E.

Referring to FIG. 41 and FIG. 42, each lead 12E includes a first region41E to come into contact with the corresponding conductive layer 17E;and a second region 45E on the daughterboard 5A side (Z2 side) of thefirst region 41E. The second region 45E is lower in wettability withrespect to the liquid melt of the conductive layer 17E than the firstregion 41E.

Each lead 12E may further include a third region 47E across the firstregion 41E from the second region 45E. The third region 47E is lower inwettability with respect to the liquid melt of the conductive layer 17Ethan the first region 41E.

Each lead 12E may further include a fourth region 43E to come intocontact with the adhesive agent 19A (FIG. 45A and FIG. 46A) on thedaughterboard 5A side (Z2 side) of the second region 45E. The adhesiveagent 19 adheres the leads 12E to the daughterboard 5A. The fourthregion 43E is higher in wettability with respect to the liquid melt ofthe adhesive agent 19A than the second region 45E. In other words, thesecond region 45E is lower in wettability with respect to the liquidmelt of the adhesive agent 19A than the fourth region 43E.

Accordingly, each lead 12E includes a low wettability region (the thirdregion 47E), a high wettability region (the first region 41E), a lowwettability region (the second region 45E), and a high wettabilityregion (the fourth region 43E) in this order in the Z2 direction fromthe Z1 side.

Each of the first, second, third, and fourth regions 41E, 45E, 47E, and43E may be provided on each of the X1, X2, Y1, and Y2 sides of the leads12E so as to define their peripheral surfaces.

The conductive layers 17E may be formed of, for example, solder. In thiscase, the first region 41E and the fourth region 43E are formed of ametal having high solder wettability, while the second region 45E andthe third region 47E are formed of a metal having low solderwettability, resin, or an oxide coating. Any appropriate method may beemployed to form such regions different in wettability. Such a methoduses, for example, photolithography and etching the same as in the caseof the first and second signal pad electrodes 164A and 166A (firstembodiment). For example, the method illustrated in FIGS. 16A through16D, FIGS. 17A through 17C, FIGS. 18A and 18B, or FIGS. 19A through 19Dmay be employed.

FIGS. 44A and 44B are diagrams illustrating a method of joining theleads 12E and the corresponding pad electrodes 16E, which is part of amethod of manufacturing the jack connector 3A according to the secondembodiment. FIG. 44A illustrates a first heat treatment process, andFIG. 44B illustrates a second heat treatment process.

In the process of FIG. 44A, first, a solder paste 17Ea having a highmelting point, such as a Sn—In alloy having a melting point ofapproximately 190° C., is applied on each of the pad electrodes 16Eprovided on the front (X2-side) surface of the wiring board 11E. Thearea of application of the high-melting-point solder paste 17Ea maycorrespond to the first region 42E of each pad electrode 16E and thefirst region 41E of each lead 12E. In this case, it is ensured that thehigh-melting-point solder paste 17Ea melted by below-described heattreatment spreads over and wets both of the first region 42E and thefirst region 41E while contracting in volume to crush air gaps insidethe high-melting-point solder paste 17Ea. Further, in this case, themolten high-melting-point solder paste 17Ea moves from the secondregions 44E and 45E of lower solder wettability to the first regions 42Eand 41E, respectively, of higher solder wettability.

After application of the high-melting-point solder paste 17Ea, the padelectrodes 16E and the corresponding leads 12E are aligned and fixedusing a first fixation jig (not graphically illustrated).

Next, the high-melting-point solder paste 17Ea is melted by heattreatment and then solidified to form the conductive layers (solderlayers) 17E of a high melting point. As a result, the leads 12E areconnected to the corresponding pad electrodes 16E through thehigh-melting-point conductive layers 17E. Then, the first fixation jigis removed.

Next, in the process of FIG. 44B, a solder paste 17Eb having a lowmelting point, such as a Sn—Bi alloy having a melting point ofapproximately 140° C., is applied on each of the pad electrodes 16Eprovided on the rear (X1-side) surface of the wiring board 11E.

Next, the pad electrodes 16E and the corresponding leads 12E provided onthe rear (X1-side) surface of the wiring board 11E (the remaining padelectrodes 16E and leads 12E) are aligned and fixed using a secondfixation jig (not graphically illustrated).

Next, heat treatment is performed at a temperature lower than themelting point of the high-melting-point conductive layers 17E and higherthan the melting point of the low-melting-point solder paste 17Eb. Thus,the low-melting-point solder paste 17Eb is melted, and then solidifiedto form the conductive layers (solder layers) 17E of a low meltingpoint. As a result, the remaining leads 12E are connected to thecorresponding remaining pad electrodes 16E through the low-melting-pointconductive layers 17E. Then, the second fixation jig is removed.

According to the joining method illustrated in FIGS. 44A and 44B, thesecond heat treatment process is performed at a temperature lower thanthe melting point of the high-melting-point conductive layers 17E.Accordingly, it is possible to prevent the high-melting-point conductivelayers 17E from melting during the second heat treatment process. As aresult, it is possible to maintain the positional relationship betweenthe leads 12E and the corresponding pad electrodes 16E (on the front[X1-side] surface of the wiring board 11E) positioned in the first heattreatment process.

Referring back to FIG. 42, the center C1 of the first region 41E of eachlead 12E is offset in a direction away from the daughterboard 5A (in theZ1 direction) relative to the center C2 of the first region 42E of thecorresponding pad electrode 16E. That is, each conductive layer (solderlayer) 17E is formed to have its contact surface with the correspondinglead 12E offset in a direction away from the daughterboard 5A (in the Z1direction) relative to its contact surface with the wiring board 11E(the corresponding pad electrode 16E). Accordingly, the conductive layer(solder layer) 17 has a substantially parallelogram-shaped cross sectionalong the X-Z plane as illustrated in FIG. 42, for example.

Reheating the conductive layer (solder layer) 17E in this state causesthe conductive layer 17E to melt to take a shape reduced in surface area(that is, a shape having a rectangular cross section) because of itssurface tension.

If the second region 45E and the third region 47E of lower solderwettability were not present or formed to have the first region 41E tocome into surface contact with the conductive layer 17E interposedbetween them, the molten conductive layer 17E would move on the lead 12Ein the Z1-Z2 directions to reduce its surface area. Further, if thesecond regions 44E of lower solder wettability were not present orformed to have the first region 42E to come into surface contact withthe conductive layer 17E interposed between them, the molten conductivelayer 17E would move on the wiring board 11E (the pad electrode 16E) inthe Z1-Z2 directions to reduce its surface area.

According to this embodiment, the second region 45E and the third region47E are provided to have the first region 41E to come into surfacecontact with the conductive layer 17E sandwiched between them, and thesecond regions 44E are provided to have the first region 42E to comeinto surface contact with the conductive layer 17E sandwiched betweenthem. This prevents the molten conductive layer (solder layer) 17E frommoving on the lead 12E or the wiring board 11E (the pad electrode 16E)in the Z1-Z2 directions. Accordingly, the molten conductive layer(solder layer) 17E causes the lead 12E to move in a direction toapproach the daughterboard 5A relative to the wiring board 11E in orderto reduce the surface area of the conductive layer 17E. This makes itpossible to urge the lead 12E toward the daughterboard 5A and ensure theconnection of the lead 12E to the daughterboard 5A when the conductivelayer 17E melts.

Further, according to this embodiment, the second region 45E of lowersolder wettability is between the first region 41E to come into surfacecontact with the conductive layer (solder layer) 17E and the fourthregion 43E to come into surface contact with the daughterboard 5A.Accordingly, the molten conductive layer 17E is prevented from moving onthe lead 12E in the Z2 direction and coming into contact with thedaughterboard 5A. This makes it possible to prevent the moltenconductive layer 17E from adversely affecting the joining of the lead12E and the daughterboard 5A.

Further, according to this embodiment, as illustrated in FIG. 41, theinsulating layer 112E (third region) of low solder wettability ispresent on both lateral sides (Y1 and Y2 sides) of the first region 42Eto come into surface contact with the conductive layer (solder layer)17E. This prevents the molten conductive layer 17E from moving on thewiring board 11E in the Y1-Y2 directions. As a result, it is possible toprevent the molten conductive layer 17E from electrically connectingadjacent pad electrodes 16E.

Further, according to this embodiment, as illustrated in FIG. 42, theleads 12E are provided on both sides (X1 and X2 sides) of the wiringboard 11E. Accordingly, the number of leads provided (per wiring board)can be increased compared with the case of providing leads on one sideof a wiring board on the assumption that the leads are provided at thesame intervals in both cases. Accordingly, the jack connector 3A of thisembodiment can be reduced in size.

FIGS. 45A and 45B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 45A,respectively, of part of the jack connector 3A and the daughterboard 5A,illustrating placement of the jack connector 3A on the daughterboard 5Aaccording to this embodiment. In FIG. 45B, the adhesive agent 19A andthe daughterboard 5A are omitted for convenience of graphicalrepresentation.

The adhesive agent 19A for adhering (bonding) the leads 12E to thedaughterboard 5A is provided on the daughterboard 5A. The adhesive agent19A may be a solder paste higher in melting point than the conductivelayers (solder layer) 17E. Examples of the adhesive agent 19A include aSn—Ag—Cu alloy having a melting point of 220° C. In the case illustratedin FIGS. 45A and 45B, there is a gap between some of the leads 12E andthe adhesive agent (solder paste) 19A due to the (surface) warpage ofthe daughterboard 5A.

FIGS. 46A and 46B are a front-side cross-sectional view and across-sectional view taken along one-dot chain line A-A of FIG. 46A,respectively, of part of the jack connector 3A and the daughterboard 5Aafter heating the structure of FIGS. 45A and 45B, illustrating amounting structure of the jack connector 3A according to thisembodiment. In FIG. 46B, the adhesive agent 19A and the daughterboard 5Aare omitted for convenience of graphical representation.

When the adhesive agent (solder paste) 19A is caused to melt byapplication of heat, the conductive layers (solder layers) 17E melt toallow the leads 12E to move inside the corresponding guide grooves 132E.In this state, the surface tension of the molten conductive layers 17Ecauses the leads 12E to be pushed out of the corresponding guide grooves132E in the Z2 direction so as to absorb the (surface) warpage of thedaughterboard 5A. As a result, it is possible to ensure the connectionof the leads 12E to the daughterboard 5A after the heat treatment, sothat it is possible to increase the reliability of the electrical andmechanical connections of the leads 12E to the daughterboard 5A.

Further, according to the above-described configuration, the secondregion 45E of lower solder wettability is formed between the firstregion 41E to come into contact with the conductive layer 17E and thefourth region 43E to come into contact with the adhesive agent (solderpaste) 19A. Accordingly, it is possible to prevent the interdiffusion ofthe liquid melt of the conductive layer 17E and the liquid melt of theadhesive agent 19A by separating the liquid melts from each other. Thismakes it possible to maintain the compositions of the conductive layer17E and the adhesive agent 19A and thus to obtain a target or desiredjoining strength and durability after heat treatment, so that it ispossible to increase the reliability of the mechanical connection of theleads 12E and the daughterboard 5A.

The present invention is not limited to this embodiment, and variationsand modifications may be made without departing from the scope of thepresent application.

For example, in this embodiment, the present invention is applied to thejack connector 3A. However, the present invention is not limited tothis, and may also be applied to the plug connector 2A (for example,FIG. 8).

Further, in this embodiment, some of the leads 12E are connected to thefront (X2-side) surface of the wiring board 11E through the conductivelayers (solder layers) 17A of a high melting point, and thereafter, theremaining leads 12E are connected to the rear (X1-side) surface of thewiring board 11E through the conductive layers (solder layers) 17A of alow melting point. However, the present invention is not limited to thisconfiguration. For example, all the leads 12E may be connected to thefront (X2-side) and rear (X1-side) surfaces of the wiring board 11Esimultaneously through the conductive layers 17E of the same meltingpoint.

Further, according to this embodiment, as illustrated in FIGS. 44A and44B, the solder pastes 17Ea and 17Eb provided between the pad electrodes16E and the corresponding leads 12E are melted by heat treatment andsolidified to form the conductive layers (solder layers) 17E, but thepresent invention is not limited to this configuration. For example, asolder layer may be formed on one or both of the first regions 41E and42E before providing the solder paste 17Ea or 17Eb. Preforming such asolder layer further ensures that the solder melted by heat treatmentspreads over and wets the first regions 41E and 42E.

Further, as illustrated in FIG. 42, the conductive layers 17E have asubstantially parallelogram-shaped cross section along the X-Z plane,but the present invention is not limited to this configuration. Forexample, the conductive layers 17E may have a substantially trapezoidalshape. In this case, the cross-sectional shape of the molten conductivelayers 17E is caused to become an isosceles trapezoid because of theirsurface tension.

Further, according to this embodiment, as illustrated in FIG. 42, oneconductive layer 17E is provided between each pad electrode 16E and thecorresponding lead 12E. However, the present invention is not limited tothis configuration, and as illustrated in FIG. 47, multiple conductivelayers 17F may be provided between one pad electrode 16F and acorresponding one lead 12F. In this case, the pad electrode 16F includesfirst regions 42F and a fourth region 48F provided between the adjacentfirst regions 42F, and the lead 12F includes first regions 41F and afifth region 49F provided between the adjacent first regions 41F. Thefourth region 48F and the fifth region 49F are lower in wettability withrespect to the liquid melt of the conductive layers 17F than the firstregions 42F and the first regions 41F, respectively. The centers F1 andG1 of the first regions 41F of the lead 12F is offset in a directionaway from an external board (in the Z1 direction) relative to thecenters F2 and G2, respectively, of the first region 42F of thecorresponding pad electrode 16F (a wiring board 11F).

Further, according to this embodiment, the conductive layers 17E may beformed of solder. The conductive layers 17E are not limited toparticular types of materials and may be formed of any material as longas the conductive layers 17E are meltable at the time of bonding theleads 12E to the daughterboard 5A. For example, the conductive layers17E may be formed of a metal other than solder, such as In having amelting point of approximately 160° C. Further, the starting material ofthe conductive layers 17E may be in the form of either paste or foil.

Further, according to this embodiment, the conductive layers 17E have alower melting point than the adhesive agent 19A for bonding the leads12E to the daughterboard 5A. However, the conductive layers 17E have ahigher melting point than the adhesive agent 19A as long as theconductive layers 17E are meltable at the time of bonding the leads 12Eto the daughterboard 5A.

Further, according to this embodiment, solder is used for the adhesiveagent 19A. However, the adhesive agent 19A is not limited to particulartypes. For example, an anisotropic conductive film (ACF) formed of amixture of thermosetting resin and metal particulates, or a metal otherthan solder may be used for the adhesive agent 19A. The adhesive agent19A may be in the form of either paste or foil.

The present invention is not limited to the specifically disclosedembodiments, and variations and modifications may be made withoutdeparting from the scope of the present invention.

1. A connector, comprising: a wiring board; a lead configured to connectthe wiring board electrically to an external board; and a conductivelayer configured to connect the lead to the wiring board so as to allowthe lead to move in predetermined directions relative to the wiringboard when the conductive layer is melted, wherein the lead includes afirst region, a second region, and a third region, the first regionbeing in contact with the conductive layer and being sandwiched betweenthe second region and the third region in directions parallel to thepredetermined directions, the second region and the third region beinglower in wettability with respect to a liquid melt of the conductivelayer than the first region, the wiring board includes a first regionand a pair of second regions, the first region being in contact with theconductive layer and being sandwiched between the second regions in thedirections parallel to the predetermined directions, the second regionsbeing lower in wettability with respect to the liquid melt of theconductive layer than the first region, and a center of the first regionof the lead is offset in a direction parallel to the predetermineddirections and away from the external board relative to a center of thefirst region of the wiring board.
 2. The connector as claimed in claim1, wherein the wiring board further includes a pair of third regions,the third regions being lower in wettability with respect to the liquidmelt of the conductive layer than the first region of the wiring board,the first region of the wiring board being sandwiched between the thirdregions in directions perpendicular to the predetermined directions. 3.The connector as claimed in claim 1, further comprising: an insulativespacer fixed to the wiring board, the insulative spacer including aguide groove configured to guide the lead in the predetermineddirections when the conductive layer is melted; and a window part formednear the guide groove.